Research Institute of Electrical Communication Tohoku University

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Tohoku University’s Center for Innovative Integrated Electronic Systems (CIES), led by Professor Tetsuo Endoh (Graduate School of Engineering at Tohoku University) has announced success on a collaboration between CIES and semiconductor test equipment supplier Advantest Corporation.

The joint research team has developed a high-speed, high-precision module that can measure the switching currents in the memory arrays of spin-transfer torque magnetic random access memory (STT-MRAM), a highly-anticipated next-generation memory technology, in units of microamperes and nanoseconds, using an Advantest memory test system.

 

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