20200820 下記の論文がJournal of Applied Physics誌に掲載されました．
K. Yamasue and Y. Cho, Nanoscale characterization of unintentional doping of atomically thin layered semiconductors by scanning nonlinear dielectric microscopy, J. Appl. Phys. 128(7), 074301 (2020).
J. Woerle, B. C. Johnson, C. Bongiorno, K. Yamasue, G. Ferro, D. Dutta, T. A. Jung, H. Sigg, Y. Cho, U. Grossner, and M. Camarda, The SiO2/4H-SiC Interface on Stepped Surfaces, Two-dimensional defect mapping of the SiO2/4H−SiC interface, Phys. Rev. Materials 3, 084602 (2019). [Editor's suggestion]
20180611 下記の論文がApplied Physics Letters誌に掲載されました．
K. Yamasue and Y. Cho, Local carrier distribution imaging on few-layer MoS2 exfoliated on SiO2 by scanning nonlinear dielectric microscopy, Appl. Phys. Lett. 112(24), 243102(2018).
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