#author("2022-06-12T01:56:16+00:00","default:masterbind","masterbind")
#author("2022-06-14T00:35:17+00:00","default:masterbind","masterbind")
* Book chapter[#z3fc4f2e]
+ %%%K. Yamasue%%% and T. Hikihara, Nonlinear dynamics in atomic force microscopy and its control for nanoparticle manipulation, in [[Nonlinear Dynamics of Nanosystems (2010, Wiley-VCH):http://www.amazon.com/Nonlinear-Dynamics-Nanosystems-G-Radons/dp/352740791X]], Eds. by G. Radons, B. Rumpf, and H. G. Schuster.
+ T. Hikihara and %%%K. Yamasue%%%, Transient Dynamics of Duffing System under Time Delayed Feedback Control: Global Phase Structure and Application to Engineering, in [[Handbook of Chaos Control Second completely revised and enlarged edition (2007, Wiley-VCH):http://www.amazon.com/Handbook-Chaos-Control-Eckehard-Sch/dp/3527406050]], Eds. by E. Schöll and H. G. Schuster.  
 
* Tutorial / invited papers [#e41bc8a4]
+ %%%K. Yamasue%%% and Y. Cho, Atomic resolution studies on surface dipoles by noncontact scanning nonlinear dielectric microscopy and potentiometry, [[in 2020 Joint Conference of the IEEE International Frequency Control Symposium and International Symposium on Applications of Ferroelectrics (IFCS-ISAF), Keystone, CO, USA (2020):https://doi.org/10.1109/IFCS-ISAF41089.2020.9234884]]
+ %%%K. Yamasue%%%, N. Chinone, Y. Cho，Introduction of scanning nonlinear dielectric microscopy and its applications to the evaluation of electronic materials and devices，[[The Journal of the Institute of Electrical Engineers of Japan, 137(10), 697(2017 in Japanese):https://www.jstage.jst.go.jp/browse/ieejjournal/137/10/_contents]]
+ %%%K. Yamasue%%%, Atomic dipole imaging: NC-SNDM study on a hydrogen-terminated Si surface, [[Imaging & Microscopy 17(3), 43(2015):http://www.imaging-git.com/science/scanning-probe-microscopy/atomic-dipole-imaging]].
+ %%%K. Yamasue%%% and T. Hikihara， Stabilization of cantilever oscillation in dynamic-mode atomic force microscopy using time-delayed feedback, [[KENBIKYO 45(2)，137 (2010):http://ci.nii.ac.jp/naid/40017226317]](in Japanese).
+ %%%K. Yamasue%%% and T. Hikihara， Recent Trends and Perspectives on Control Application in Atomic Force Microscopy，[[ISCIE Journal 'Systems, Control and Information' 53(6)，236 (2009):http://ci.nii.ac.jp/naid/110007338392]](in Japanese). 

* Journal articles [#c4d27229]
+ %%%K. Yamasue%%% and Y. Cho, Local capacitance-voltage profiling and deep level transient spectroscopy of SiO2/SiC interfaces by scanning nonlinear dielectric microscopy, [[Microelectron. Reliab. 135, 114588 (2022):https://doi.org/10.1016/j.microrel.2022.114588?_ga=2.20495230.717820907.1654846263-589815064.1654846263]].
+ %%%K. Yamasue%%% and Y. Cho, Local capacitance-voltage profiling and deep level transient spectroscopy of SiO2/SiC interfaces by scanning nonlinear dielectric microscopy, [[Microelectron. Reliab. 135, 114588 (2022):https://doi.org/10.1016/j.microrel.2022.114588]].
+ Y. Ogata, %%%K. Yamasue%%%, X. Zhang, T. Matsumoto, N. Tokuda, and Y. Cho, Microscopic evaluation of Al2O3/p-type diamond (111) interfaces using scanning nonlinear dielectric microscopy, [[Mater. Sci. Forum 1062, 298 (2022):https://doi.org/10.4028/p-n0z51t]]
+ %%%K. Yamasue%%% and Y. Cho, Surface potential fluctuations of SiO2/SiC interfaces investigated by local capacitance-voltage profiling based on time-resolved scanning nonlinear dielectric microscopy, [[Mater. Sci. Forum 1062, 335 (2022):https://doi.org/10.4028/p-2t7zak]]
+ %%%K. Yamasue%%% and Y. Cho, Boxcar averaging scanning nonlinear dielectric microscopy, [[Nanomaterials 12(5), 794 (2022):https://doi.org/10.3390/nano12050794]].
+ K. Suzuki, %%%K. Yamasue%%%, and Y. Cho, Nanoscale capacitance-voltage profiling of DC bias induced stress on a high-κ/SiO2/Si gate stack, [[Microelectron. Reliab. 126, 114278 (2021):https://doi.org/10.1016/j.microrel.2021.114278]].
+ %%%K. Yamasue%%% and Y. Cho, Local capacitance-voltage profiling and high voltage stress effect study of SiO2/SiC structures by time-resolved scanning nonlinear dielectric microscopy, [[Microelectron. Reliab. 126, 114284(2021):https://doi.org/10.1016/j.microrel.2021.114284]].
+ Yasuo Cho, Jun Hirota, %%%Kohei Yamasue%%%, Profiling of carriers in a 3D flash memory cell with nanometer-level resolution using scanning nonlinear dielectric microscopy, [[Microelectron. Reliab. 114, 113774 (2020).:https://doi.org/10.1016/j.microrel.2020.113774]]
+ %%%K. Yamasue%%% and Y. Cho, Spatial scale dependent impact of non-uniform interface defect distribution on field effect mobility in SiC MOSFETs, 	[[Microelectron. Reliab. 114, 113829 (2020).:https://doi.org/10.1016/j.microrel.2020.113829]]
+ %%%K. Yamasue%%% and Y. Cho, Nanoscale characterization of unintentional doping of atomically thin layered semiconductors by scanning nonlinear dielectric microscopy, [[J. Appl. Phys. 128(7), 074301 (2020).:https://doi.org/10.1063/5.0016462]]
+ %%%K. Yamasue%%%, Y. Yamagishi, and Y. Cho, Influence of non-uniform interface defect clustering on field-effect mobility in SiC MOSFETs investigated by local deep level transient spectroscopy and device simulation, [[Mater. Sci. Forum 1004, 627-634(2020).:https://doi.org/10.4028/www.scientific.net/MSF.1004.627]]
+ %%%K. Yamasue%%% and Y. Cho, Optimization of signal intensity in intermittent contact scanning nonlinear dielectric microscopy, [[Microelectronics Reliability 100-101, 113345 (2019):https://doi.org/10.1016/j.microrel.2019.06.037]]
+ J. Woerle, B. C. Johnson, C. Bongiorno, %%%K. Yamasue%%%, G. Ferro, D. Dutta, T. A. Jung, H. Sigg, Y. Cho, U. Grossner, and M. Camarda, The SiO2/4H-SiC Interface on Stepped Surfaces, Two-dimensional defect mapping of the SiO2/4H−SiC interface, [[Phys. Rev. Materials 3, 084602 (2019).:https://doi.org/10.1103/PhysRevMaterials.3.084602]]
+ %%%K. Yamasue%%% and Y. Cho, Local carrier distribution imaging on few-layer MoS2 exfoliated on SiO2 by scanning nonlinear dielectric microscopy, [[Appl. Phys. Lett. 112(24), 243102(2018).:https://doi.org/10.1063/1.5032277]]
+ %%%K. Yamasue%%%, H. Fukidome, K. Tashima, M. Suemitsu, and Y. Cho,  Graphene on C-terminated face of 4H-SiC observed by noncontact scanning nonlinear
dielectric potentiometry, [[Jpn. J. Appl. Phys. 55(8S1), 08NB02 (2016).:http://dx.doi.org/10.7567/JJAP.55.08NB02]]
+ %%%K. Yamasue%%% and Y. Cho, Scanning nonlinear dielectric potentiometry, [[Rev. Sci. Instrum. 86(9), 093704 (2015).:http://dx.doi.org/10.1063/1.4930181]]
+ M. Suzuki, %%%K. Yamasue%%%, and Y. Cho, Experimental study of electric dipoles on an oxygen-adsorbed Si(100)-2×1 surface by non-contact scanning nonlinear dielectric microscopy, [[Appl. Phys. Lett. 107(4),031604 (2015).:http://dx.doi.org/10.1063/1.4927244]]
+ %%%K. Yamasue%%%, H. Fukidome, K. Funakubo, M. Suemitsu, and Y. Cho, Interfacial charge states in graphene on SiC studied by noncontact scanning nonlinear dielectric potentiometry, [[Phys. Rev. Lett. 114, 226103 (2015).:http://dx.doi.org/10.1103/PhysRevLett.114.226103]]
+ %%%K. Yamasue%%%, M. Abe, Y. Sugimoto, Y. Cho, Atomic-dipole-moment induced local surface potential on Si(111)-(7×7) surface studied by non-contact scanning nonlinear dielectric microscopy, [[Appl. Phys. Lett. 105(13), 12160, (2014).:http://dx.doi.org/10.1063/1.4896323]]
+ M. Suzuki, %%%K. Yamasue%%%, M. Abe, Y. Sugimoto, and Y. Cho, Improved study of electric dipoles on the Si(100)-2×1 surface by non-contact scanning nonlinear dielectric microscopy, [[Appl. Phys. Lett. 105(10), 101603 (2014).:http://dx.doi.org/10.1063/1.4895031]]
+ N. Chinone, %%%K. Yamasue%%%, K. Honda, Y. Cho, High resolution imaging in cross-section of a metal-oxide-semiconductor field-effect-transistor using super-higher-order nonlinear dielectric microscopy, [[J. Phys.: Conf. Ser.  471(1), 012023(2013).:http://dx.doi.org/10.1088/1742-6596/471/1/012023]]
+ D. Mizuno, %%%K. Yamasue%%%, Y. Cho, Atomic dipole moment distribution on a hydrogen-adsorbed Si(111)-7×7 surface observed by noncontact scanning nonlinear dielectric microscopy,  [[Appl. Phys. Lett. 103(10), 101601(2013).:http://link.aip.org/link/doi/10.1063/1.4820348]]
+ %%%K. Yamasue%%% and Y. Cho, Simultaneous measurement of tunneling current and atomic dipole moment on Si(111)-(7×7) surface by noncontact scanning nonlinear dielectric microscopy, [[J. Appl. Phys. 113(1), 014307(2013).:http://link.aip.org/link/doi/10.1063/1.4772705]]
+ N. Chinone, %%%K. Yamasue%%%, K. Honda, Y. Hiranaga, and Y. Cho, Lateral resolution improvement in scanning nonlinear dielectric microscopy by measuring super-higher-order nonlinear dielectric constants, [[Appl. Phys. Lett. 101(21), 213112 (2012).:http://dx.doi.org/10.1063/1.4766349]]
+ N. Sawai, %%%K. Yamasue%%%,and Y. Cho, Atomic scale imaging of TiO2(100) reconstructed surfaces by non-contact scanning nonlinear dielectric microscopy, [[Jpn. J. Appl. Phys. 51, 121801 (2012).:http://dx.doi.org/10.1143/JJAP.51.121801]]
+ N. Chinone,%%%K. Yamasue%%%, Y. Hiranaga, and Y. Cho, Observation of nanoscale ferroelectric domains using super higher-order nonlinear dielectric microscopy, [[Jpn. J. Appl. Phys. 51(9), 09LE07(2012):http://dx.doi.org/10.1143/JJAP.51.09LE07]].
+ %%%K. Yamasue%%% and Y. Cho, Observation of polarization distribution on Si(111) surface by scanning nonlinear dielectric microscopy, [[Jpn. J. Appl. Phys. 50(9), 09NE12(2011):http://dx.doi.org/10.1143/JJAP.50.09NE12]].
+ %%%K. Yamasue%%%, K. Kobayashi, H. Yamada, K. Matsushige, and T. Hikihara, Controlling chaos in dynamic-mode atomic force microscope, [[Phys. Lett. A 373(35), 3140 (2009):http://dx.doi.org/10.1016/j.physleta.2009.07.009]].
+ %%%K. Yamasue%%% and T. Hikihara, Control of microcantilevers in dynamic force microscopy using time delayed feedback, [[Rev. Sci. Instrum. 77(5), 053703 (2006):http://link.aip.org/link/?rsi/77/053703]].
+ %%%K. Yamasue%%% and T. Hikihara, Persistence of chaos in a time-delayed-feedback controlled Duffing system, [[Phys. Rev. E 73(3), 036209 (2006):http://link.aps.org/abstract/PRE/v73/e036209]].
+ %%%K. Yamasue%%% and T. Hikihara, Domain of attraction for stabilized orbits in time delayed feedback controlled Duffing systems, [[Phys. Rev. E 69(5), 056209 (2004):http://link.aps.org/abstract/PRE/v69/i5/p056209]]. 

* International conference proceedings [#e1d36156]
+ %%%K. Yamasue%%% and Y. Cho, Visualization of nanoscale carrier dynamics at SiO2/SiC interfaces by time-resolved scanning nonlinear dielectric microscopy, The 41th Annual NANO Testing Symposium (NANOTS2021), online, 21-26, Oct. 25-27(2021).
+ K. Suzuki, %%%K. Yamasue%%%, Y. Cho, Measurement of local capacitance-voltage characteristics on high-κ/SiO2/Si under DC bias stress using time-resolved scanning nonlinear dielectric microscopy, The 41th Annual NANO Testing Symposium (NANOTS2021), 116-121, online, Oct. 25-27(2021).
+ Y. Ogata, %%%K. Yamasue%%%, X. Zhang, T. Matsumoto, N. Tokuda, and Y. Cho, Nanoscale study of interface defect density evaluation at diamond MOS interfaces using time-resolved scanning nonlinear dielectric microscopy, The 41th Annual NANO Testing Symposium (NANOTS2021), 110-115, online, Oct. 25-27(2021).
+ %%%K. Yamasue%%% and Y. Cho, Simultaneous interface defect density and differential capacitance imaging by time-resolved scanning nonlinear dielectric microscopy, [[Proceedings from the 47th International Symposium for Testing and Failure Analysis, 441-445, Phoenix Convention Center, Phoenix, Arizona, USA, Oct. 31-Nov. 4 (2021):https://doi.org/10.31399/asm.cp.istfa2021p0441]].
+ %%%K. Yamasue%%% and Y. Cho, Local capacitance-voltage profiling and deep level transient spectroscopy of SiO2/SiC interfaces by scanning nonlinear dielectric microscopy, [[2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA):https://doi.org/10.1109/IPFA53173.2021.9617348]], Sep. 14 - Oct. 13, virtual (2021).
+ %%%K. Yamasue%%%, and Y. Cho, Improvement of signal-to-noise ratio in 
semiconductor carrier distribution imaging by intermittent scanning nonlinear dielectric microscopy,The 39th Annual NANO Testing Symposium (NANOTS2019), 130-134, KFC Hall, Kokusai Fashion Center, Tokyo, Japan, Nov. 18–19 (2019). 
+ A. Hosaka, %%%K. Yamasue%%%, J. Woerle, G. Ferro,U. Grossner, M. Camarda, and Y. Cho, Evaluation of interface defect density distribution on macrostepped
SiO2/SiC by time-resolved local deep level transient spectroscopy, The 39th Annual NANO Testing Symposium (NANOTS2019), 75-79, KFC Hall, Kokusai Fashion Center, Tokyo, Japan, Nov. 18–19 (2019). 
+ K. Takano, %%%K. Yamasue%%%, and Y. Cho, Development of cantilevers with insulating coating for semiconductor carrier distribution imaging using scanning nonlinear dielectric microscopy and its application to layered semiconductors, The 39th Annual NANO Testing Symposium (NANOTS2019), 135-140, KFC Hall, Kokusai Fashion Center, Tokyo, Japan, Nov. 18–19 (2019). 
+ A. Hosaka, %%%K. Yamasue%%%, J. Woerle, G. Ferro,U. Grossner, M. Camarda, and Y. Cho, Spatially-resolved evaluation of interface defect density on macrostepped SiO2/SiC using local deep level transient spectroscopy, [[2019 International Integrated Reliability Workshop (IIRW) (2019):https://doi.org/10.1109/IIRW47491.2019.8989888]]
+ K. Suzuki, %%%K. Yamasue%%%, Y. Cho, A study on evaluation of interface defect density on high-κ/SiO2/Si and SiO2/Si gate stacks using scanning nonlinear dielectric microscopy, [[2019 International Integrated Reliability Workshop (IIRW) (2019):https://doi.org/10.1109/IIRW47491.2019.8989881]]
+ %%%K. Yamasue%%% and Y. Cho, Boxcar averaging based scanning nonlinear dielectric microscopy and its application to carrier distribution imaging on 2D semiconductors, [[2019 International Integrated Reliability Workshop (IIRW) (2019):https://doi.org/10.1109/IIRW47491.2019.8989887]]
+ %%%K. Yamasue%%% and Y. Cho, Unintentional doping effects on atomically-thin Nb-doped MoS2 observed by scanning nonlinear dielectric microscopy, [[Proceedings from the 45th International Symposium for Testing and Failure Analysis, 498-503, Nov. 10-14, Portland, Oregon USA (2019):https://doi.org/10.31399/asm.cp.istfa2019p0498]].
+ %%%K. Yamasue%%% and Y. Cho, Improved signal intensity in carrier distribution imaging of few-layer MoS2 by scanning nonlinear dielectric microscopy, The 38th Annual NANO Testing Symposium (NANOTS2018), 196-199, KFC Hall, Kokusai Fashion Center, Tokyo, Japan, Nov. 19–20 (2018).
+ %%%K. Yamasue%%% and T. Hikihara, Suppression of subharmonics and chaos in tapping mode atomic force microscopy using time delayed feedback control, 2006 International Symposium on Nonlinear Theory and its Applications, 927-930, Bologna, Italy, September 11-14 (2006).
+ %%%K. Yamasue%%% and T. Hikihara, A study on vibration characteristics of microcantilever probe near period-doubling bifurcation, [[Proceedings of the 2005 International Symposium on Nonlinear Theory and its Applications, 582-585, SEC@BRUGES, Bruges, Belgium, October 18-21 (2005):https://doi.org/10.34385/proc.40.3-4-5-5]].
+ %%%K. Yamasue%%% and T. Hikihara, Annihilation of periodic orbits in time delayed feedback controlled systems, [[Proceedings of the 2005 International Symposium on Nonlinear Theory and its Applications, 162-165, SEC@BRUGES, Bruges, Belgium, October 18-21 (2005):https://doi.org/10.34385/proc.40.2-4-2-5]].
+ T. Hikihara and %%%K. Yamasue%%%, A Numerical Study on Suspension of Molecules by Microcantilever Probe, Proceedings of the Fifth International Symposium on Linear Drives for Industry Applications (LDIA2005), 29-32, Awaji, Hyogo, September 25-28 (2005).
+ %%%K. Yamasue%%% and T. Hikihara, A study on multiple steady states and their relation to global structure in time delayed feedback controlled Duffing System, Proceedings of the 2004 International Symposium on Nonlinear Theory and its Applications, 259-262, Fukuoka, Japan, November 29 - December 3 (2004).

* International conference presentation [#j22270e6]
+ %%%K. Yamasue%%% and Y. Cho, Surface potential fluctuations of SiO2/SiC interfaces investigated by local capacitance-voltage profiling based on 
time-resolved scanning nonlinear dielectric microscopy, The 13th European Conference on Silicon Carbide and Related Materials (ECSCRM 2020·2021), We-2B-01, Vinci International Convention Centre/virtual(hybrid), Tours, France, Oct. 24-28 (2021).
+ Y. Ogata, %%%K. Yamasue%%%, X. Zhang, T. Matsumoto, N. Tokuda, and Y. Cho, Nanoscale evaluation of Al2O3/diamond MOS interfaces using time-resolved scanning nonlinear dielectric microscopy, The 13th European Conference on Silicon Carbide and Related Materials (ECSCRM 2020·2021), We-1B-03, Vinci International Convention Centre/virtual(hybrid), Tours, France, Oct. 24-28 (2021).
+ %%%K. Yamasue%%% and Y. Cho, Local capacitance-voltage profiling and high voltage stress effect study of SiO2/SiC structures by time-resolved scanning nonlinear dielectric microscopy, 32th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis(ESREF2021), B1-4#53, Bordeaux, France, virtual, Oct. 4-7 (2021).
+ K. Suzuki, %%%K. Yamasue%%%, Y. Cho, Nanoscale capacitance-voltage profiling of DC bias induced stress on a high-κ/SiO2/Si gate stack, 32th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis(ESREF2021), BP-2#5, Bordeaux, France, virtual, Oct. 4-7 (2021).
+ %%%K. Yamasue%%% and Y. Cho, Nanoscale analysis of unintentional p- to n-type transition on ultrathin MoS2 layers, 2021 International Conference on Nanoscience + Technology (ICN+T 2021), virtual, July 12-15 (2021).
+ K. Suzuki, %%%K. Yamasue%%%, and Y. Cho, Nanoscale capacitance-voltage characteristics measurement of a high-κ/SiO2/Si gate stack effected by DC bias stress, 2021 International Conference on Nanoscience + Technology (ICN+T 2021), virtual, July 12-15 (2021).
+ K. Takano, %%%K. Yamasue%%%, T. Kato, T. Kaneko, and Y. Cho, Nanoscale comparative study of electric field effects in atomically-thin WSe2 on SiO2 and suspended WSe2, 2021 International Conference on Nanoscience + Technology (ICN+T 2021), virtual, July 12-15 (2021).
+ %%%K. Yamasue%%% and Y. Cho, Local capacitance-voltage profiling and deep level transient spectroscopy of SiO2/SiC interfaces by scanning nonlinear dielectric microscopy, The 28th edition of the IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2021), D1.5, Sep. 14-Oct. 13, virtual (2021).
+ K. Takano, %%%K. Yamasue%%%, T. Kato, T. Kaneko, Y. Cho, Nanoscale comparison of bias dependent carrier distributions in mechanically exfoliated WSe2/SiO2 and suspended WSe2 by scanning nonlinear dielectric microscopy, 51st IEEE Semiconductor Interface Specialists Conference (SISC), Virtual conference, Dec. 16-19 (2020).
+ K. Suzuki, %%%K. Yamasue%%%, and Y. Cho, Nanoscale evaluation of DC bias stress induced interface defect density of a high-κ/SiO2/Si gate stacks using time-resolved scanning nonlinear dielectric microscopy, 51st IEEE Semiconductor Interface Specialists Conference (SISC), Virtual conference, Dec. 16-19 (2020).
+ %%%K. Yamasue%%% and Y. Cho,Microscopic capacitance-voltage characteristics measurement of a SiO2/SiC MOS structure by time-resolved scanning nonlinear dielectric microscopy, Virtual conference, Dec. 16-19 (2020).
+ J. Hirota, K. Hoshino, T. Nakai, %%%K. Yamasue%%%, and Y. Cho, Carrier profiling of the 10-nm-order structure in a 3D Flash memory cell using scanning nonlinear dielectric microscopy, the 45th International Symposium for Testing and Failure Analysis (ISTFA 2019), Portland, Oregon, USA, November 10-14 (2019)
+ A. Hosaka, %%%K. Yamasue%%%, J. Woerle, G. Ferro,U. Grossner, M. Camarda, and Y. Cho, Spatially-resolved evaluation of interface defect density on macrostepped SiO2/SiC using local deep level transient spectroscopy,IEEE International Integrated Reliability Workshop (IIRW), Stanford Sierra Conference Center Fallen Leaf Lake, CA, USA, October 13-17 (2019).
+ K. Suzuki, %%%K. Yamasue%%%, and Y. Cho, A study on evaluation of interface defect density on high-κ/SiO2/Si and SiO2/Si gate stacks using scanning nonlinear dielectric microscopy, IEEE International Integrated Reliability Workshop (IIRW), Stanford Sierra Conference Center Fallen Leaf Lake, CA, USA, October 13-17 (2019).
+ %%%K. Yamasue%%% and Y. Cho, Boxcar averaging based scanning nonlinear dielectric microscopy and its application to carrier distribution imaging on 2D semiconductors, IEEE International Integrated Reliability Workshop (IIRW), Stanford Sierra Conference Center Fallen Leaf Lake, CA, USA, October 13-17 (2019)
+ %%%K. Yamasue%%% and Y. Cho, Unintentional n-type doping on single layer Nb-doped MoS2 observed by scanning nonlinear dielectric microscopy(submited).// 2019 MRS fall meeting and exhibit
+ J. Woerle, B. C. Johnson, C. Bongiorno, %%%K. Yamasue%%%, G. Ferro, D. Dutta, Y. Cho, U. Grossner and M. Camarda, Spatially Resolved Defect Mapping of the SiO2/4H-SiC Interface,the International Conference on Silicon Carbide and Related Materials 2019 (ICSCRM 2019) We-2A-05, Kyoto International Conference Center, Kyoto, Japan, September 29 - October 4 (2019).
+ %%%K. Yamasue%%%, Y. Yamagishi, and Y. Cho, Influence of non-uniform interface defect distribution on channel mobility in SiC MOSFETs investigated by local deep level transient spectroscopy and device simulation, the International Conference on Silicon Carbide and Related Materials 2019 (ICSCRM 2019) Tu-3A-05, Kyoto International Conference Center, Kyoto, Japan, September 29 - October 4 (2019).
+ %%%K. Yamasue%%% and Y. Cho, Optimization of signal intensity in intermittent contact  scanning nonlinear dielectric microscopy, the 30th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis(ESREF 2019), Centre de Congrès Pierre Baudis, Toulouse, France, Sep. 23-26 (2019).
+ %%%K. Yamasue%%% and Y. Cho, Improvement of signal-to-noise ratio in carrier distribution imaging in intermittent contact scanning nonlinear dielectric microscopy based on boxcar integration, 18th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVIII) 5.5-O, September 8-12, Berlin, Germany (2019).
+ %%%K. Yamasue%%% and Y. Cho, Unintentional doping effects on atomically-thin Nb-doped MoS2 observed by scanning nonlinear dielectric microscopy, the 45th International Symposium for Testing and Failure Analysis (ISTFA 2019), Portland, Oregon, USA, November 10-14 (2019)
+ %%%K. Yamasue%%% and Y. Cho, Surface dipole induced potentials on metals observed by noncontact scanning nonlinear dielectric potentiometry, The 17th International Conference on the Formation of Semiconductor Interfaces (ICFSI-17), Shanghai Tianping Hotel, Shanghai, China, June 24-28 (2019).
+ %%%K. Yamasue%%%, T. Kato, T. Kaneko, and Y. Cho, Electric Field Effects on Few-Layer WSe2/SiO2 Investigated by Scanning Nonlinear Dielectric Microscopy, 2018 MRS Fall Meeting & Exhibit, EP03.01.11, Boston, Massachusetts, November 25-30 (2018).
+ %%%K. Yamasue%%%, T. Kato, T. Kaneko, and Y. Cho, Few-layer WSe2 on SiO2 observed by scanning nonlinear dielectric microscopy and electrostatic force microscopy, 14th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN-14) in conjunction with 26th International Colloquium on Scanning Probe Microscopy (ICSPM26) 22P090, Sendai International Center, Sendai, Japan, Oct. 21 - 25 (2018).
+ %%%K. Yamasue%%%, T. Kato, T. Kaneko, and Y. Cho, DC bias dependent nanoscale carrier distribution on a few-layer WSe2 on SiO2 observed by scanning nonlinear dielectric microscopy, 34th European Conference on Surface Science (ECOSS34), 2DM-CT-WED-37, Scandinavian Congress Centre, Aarhus, Denmark, Aug. 26 - 31 (2018).
+ %%%K. Yamasue%%%, T. Kato, T. Kaneko, and Y. Cho, Scanning nonlinear dielectric microscopy study on nanoscale carrier distribution in two-dimensional semiconductors, 2018 International Conference on Nanoscience + Technology (ICN+T 2018) TuA09, BVV Trade Fairs, Brno, Czech Republic, July 22 – 27(2018).
+ %%%K. Yamasue%%% and Y. Cho, Scanning nonlinear dielectric microscopy in peak-force tapping mode and its application to transition metal dichalcogenides, International Scanning Probe Microscopy 2018 (ISPM2018) Session VIII-2, Arizona State University, Tempe Campus, Tempe, Arizona, USA, May 8-11(2018).
+ %%%K. Yamasue%%% and Y. Cho, Nanoscale carrier distribution imaging of layered semiconductor materials using scanning nonlinear dielectric microscopy, 45th Conference on the Physics and Chemistry of Surfaces and Interfaces (PCSI-45), PCSI-TuM7, Sheraton Kona Resort & Spa, Kona, Hawaii, USA, Jan. 14 - Jan. 18 (2018).
+ %%%K. Yamasue%%% and Y. Cho, Local carrier distribution imaging of two-dimensional semiconductors by scanning nonlinear dielectric microscopy, 25th International Colloquium on Scanning Probe Microscopy (ICSPM25), S8-4, Atagawa Heights, Shizuoka, Japan, Dec. 7 - Dec. 9 (2017).
+ %%%K. Yamasue%%% and Y. Cho, Local carrier and charge distribution imaging on molybdenum disulfide by scanning nonlinear dielectric microscopy, The 8th International Symposium on Surface Science (ISSS-8), 4aC2-2, Tsukuba International Congress Center, Tsukuba, Japan, Oct. 22 - Oct. 26 (2017)
+ %%%K. Yamasue%%% and Y. Cho, Atomic resolution imaging and carrier type determination of molybdenum disulfide by noncontact scanning nonlinear dielectric
microscopy, 33rd European Conference on Surface Science (ECOSS-33), Thu‑9:40‑O‑SAMA, Szeged, Hungary, Aug. 27 - Sep. 1(2017).
+ %%%K. Yamasue%%% and Y. Cho, Atomic resolution imaging of MoS2 by noncontact scanning nonlinear dielectric microscopy, The 19th International Scanning Probe Microscopy Conference, WeB-2, Kyoto International Community House, Kyoto, Japan, May 16 - May 19 (2017).
+ %%%K. Yamasue%%% and Y. Cho, Polarization charge density measurement by noncontact scanning nonlinear dielectric potentiometry, 24th International Colloquium on Scanning Probe Microscopy (ICSPM24),  S2-5,  Hawaii Convention Center, Honolulu, United States of America, Dec. 14 - Dec. 16 (2016).
+ %%%K. Yamasue%%% and Y. Cho, Surface polarization on a Si(111) reconstructed surface measured by noncontact scanning nonlinear dielectric potentiometry, 32nd European Conference on Surface Science, O12-ELPS_111, Alpexpo, Grenoble, France, Aug. 28 - Sep. 2(2016).
+ %%%K. Yamasue%%% and Y. Cho, Surface polarization measurement on a reconstructed Si(111) surface by noncontact scanning nonlinear dielectric potentiometry, 19th International Conference on Non-Contact Atomic Force Microscopy, P:09, East Midlands, Conference Centre, Nottingham, United Kingdom, July 25-29 (2016).
+ %%%K. Yamasue%%%, H. Fukidome, K. Tashima, M. Suemitsu, and Y. Cho, Graphene on C-terminated Face of 4H-SiC Observed by Noncontact Scanning Nonlinear Dielectric Potentiometry, 23rd International Colloquium on Scanning Probe Microscopy (ICSPM23),  S2-1,  Hilton Niseko Villege, Hokkaido, Japan, Dec. 10 - Dec. 12 (2015).
+ %%%K. Yamasue%%%, H. Fukidome, K. Funakubo, M. Suemitsu, and Y. Cho, Simultaneous imaging of atomically resolved topography and potential of graphene on C-terminated face of SiC using scanning nonlinear dielectric potentiometry,  2015 MRS Fall Meeting & Exhibit, Q3.65, Hynes Convention Center, Boston, Massachusetts, Nov. 29 - Dec. 4 (2015). 
+ M. Suzuki, %%%K. Yamasue%%%, and Y. Cho, Investigation of oxygen adsorbed Si(100)-(2x1) surface using noncontact scanning nonlinear dielectric microscopy, 2015 MRS Fall Meeting & Exhibit, UU8.07, Hynes Convention Center, Boston, Massachusetts, Nov. 29 - Dec. 4 (2015). 
+ %%%K. Yamasue%%%,  H. Fukidome,  K. Tashima,  K. Funakubo, M. Suemitsu, and Y. Cho,  Observation of graphene on C-terminated face of SiC using noncontact scanning
nonlinear dielectric potentiometry , 18th International Conference on non contact Atomic Force Microscopy, P-Wed-37, Oustau Calendal, Cassis, France, Sep. 7 -11 (2015).
+ M. Suzuki, %%%K. Yamasue%%%, and Y. Cho, Oxygen adsorption on a Si(100)-(2x1) surface studied by noncontact scanning nonlinear dielectric microscopy, 18th International Conference on non contact Atomic Force Microscopy, P-Wed-40, Oustau Calendal, Cassis, France, Sep. 7 -11 (2015).
+ %%%K. Yamasue%%%,  H. Fukidome,  K. Tashima,  K. Funakubo, M. Suemitsu, and Y. Cho,  Graphene on C-terminated face of 4H-SiC studied by noncontact scanning nonlinear dielectric potentiometry, The 31st European Conference on Surface Science (ECOSS-31), Th-A21, International Convention Center of Barcelona, Barcelona, Spain, Aug. 31 - Sep. 4 (2015).
+ M. Suzuki, %%%K. Yamasue%%%, and Y. Cho, Non-contact scanning nonlinear dielectric microscopy study of oxygen-adsorption on a Si(100)-(2x1) surface, The 31st European Conference on Surface Science (ECOSS-31), P-Th-040, International Convention Center of Barcelona, Barcelona, Spain, Aug. 31 - Sep. 4 (2015).
+ Y. Cho and %%%K. Yamasue%%%, Scanning nonlinear dielectric potentiometry: new strategy for measuring dipole-induced potentials in atomic scale, International Scanning Probe Microscopy Conference Rio 2015, PT.03, the Ferradura Hotel, Rio De Janeiro, Brazil, June 21-24 (2015).
+ Y. Cho, %%%K. Yamasue%%%, H. Fukidome, K. Funakubo, and M. Suemitsu,
Hydrogen-intercalated graphene on SiC studied by noncontact scanning
nonlinear dielectric potentiometry, International Scanning Probe Microscopy Conference Rio 2015, OP.12, the Ferradura Hotel, Rio De Janeiro, Brazil, June 21-24 (2015).
+ %%%K. Yamasue%%%, H. Fukidome, K. Funakubo, M. Suemitsu, and Y. Cho, Comparative study on pristine and hydrogen-intercalated graphene on 4H-SiC(0001) surface using noncontact scanning nonlinear dielectric microscopy, 2014 MRS Fall Meeting & Exhibit, K6.01, Hynes Convention Center, Boston, Massachusetts, Dec. 1-5 (2014).
+ %%%K. Yamasue%%% and Y. Cho, Dipole-induced potential measurement using noncontact scanning nonlinear dielectric microscopy, 2014 MRS Fall Meeting & Exhibit, PP2.07 Hynes Convention Center, Boston, Massachusetts, Dec. 1-5 (2014).
+ M. Suzuki, %%%K. Yamasue%%%, M. Abe, Y. Sugimoto, and Y. Cho, Simultaneous observation of topography and electric dipole moments on Si(100)-2×1 surface using non-contact scanning nonlinear dielectric microscopy, 2014 MRS Fall Meeting & Exhibit, PP2.06 Hynes Convention Center, Boston, Massachusetts, Dec. 1-5 (2014).
+ M. Suzuki, %%%K. Yamasue%%%, M. Abe, Y. Sugimoto, and Y. Cho, Investigation of electric dipole moments on Si(100)-2×1 surface using non-contact scanning nonlinear dielectric microscopy, The European Conference on Surface Science, Antalya, Turkey, August 31- September 5, (2014).
+ %%%K. Yamasue%%% and Y. Cho, A new atomically resolved potentiometry for dipole-induced local surface potential based on noncontact scanning nonlinear dielectric microscopy, The European Conference on Surface Science, Antalya, Turkey, August 31- September 5, (2014).
+ %%%K. Yamasue%%%, H. Fukidome, K. Funakubo, M. Suemitsu, and Y. Cho, Investigation of hydrogen-intercalated graphene on 4H-SiC(0001) by noncontact scanning nonlinear dielectric microscopy, The European Conference on Surface Science, Antalya, Turkey, August 31- September 5, (2014).
+ M. Suzuki, %%%K. Yamasue%%%, M. Abe, Y. Sugimoto, and Y. Cho, Observation of electric dipole moments on Si(100)-2×1 surface by using non-contact scanning nonlinear dielectric microscopy, 17th International Conference on non-contact Atomic Force Microscopy, Tsukuba, Japan, August 4-8 (2014).
+ %%%K. Yamasue%%% and Y. Cho,  Surface potentiometry based on scanning nonlinear dielectric microscopy, 17th International Conference on non-contact Atomic Force Microscopy, Tsukuba, Japan, August 4-8 (2014).
+ %%%K. Yamasue%%%, H. Fukidome, K. Funakubo, M. Suemitsu, and Y. Cho, Noncontact scanning nonlinear dielectric microscopy study of graphene on 4H-SiC(0001) and its hydrogen-intercalation, 17th International Conference on non-contact Atomic Force Microscopy, Tsukuba, Japan, August 4-8 (2014).
+ M. Suzuki, %%%K. Yamasue%%%, M. Abe, Y. Sugimoto, Y. Cho, Study of electric dipole moment distribution on Si(100)-2×1 surface by non-contact scanning nonlinear dielectric microscopy, 2014 International Conference on Nanoscience + Technology, Vail, Colorado, USA, July 20-25 (2014).
+ %%%K. Yamasue%%% and Y. Cho, A novel method for simultaneous measurement of topography and dipole-induced local surface potential based on noncontact scanning nonlinear dielectric microscopy, 2014 International Conference on Nanoscience + Technology, Vail, Colorado, USA, July 20-25 (2014).
+ %%%K. Yamasue%%%, H. Fukidome, K. Funakubo, M. Suemitsu, and Y. Cho, High-resolution imaging of hydrogen-intercalated graphene on 4H-SiC(0001) using non-contact scanning nonlinear dielectric microscopy, 2014 International Conference on Nanoscience + Technology, Vail, Colorado, USA, July 20-25 (2014).
+ K. Yamasue, M. Abe, Y. Sugimoto,and Y. Cho, Site-specific measurement of atomic dipole moment induced surface potential on Si(111)-(7×7) by noncontact scanning nonlinear dielectric microscopy, the 12th International Conference on
Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN-12) in
conjunction with the 21st International Colloquium on Scanning Probe Microscopy (ICSPM21), Tsukuba International Congress Center, Tsukuba, Japan November 4-8, (2013).
+ Y. Cho, D. Mizuno, and K. Yamasue, Observation of atomic dipole moment on hydrogen and oxygen adsorbed Si(111)-7×7 surfaces by using noncontact scanning nonlinear dielectric microscopy, International Conference on Nanoscience and Technology 2013 ASS-10-Or-12, Paris. France, September 9-13 (2013).
+ K. Yamasue and Y. Cho, Atomic dipole moment induced variation of local surface potential on Si(111)-(7×7) surface studied by noncontact scanning nonlinear dielectric microscopy, International Conference on Nanoscience and Technology 2013 ASS-10-Or-11, Paris. France, September 9-13 (2013).
+ K. Yamasue, D. Mizuno,and Y. Cho, Bias voltage dependence of atomic dipole moment and topography on  hydrogen-adsorbed Si(111)-(7×7) surface studied by noncontact scanning nonlinear dielectric microscopy, 15th International Conference on non-contact Atomic Force Microscopy, POSTER SESSION II 14, University of Maryland, Colleage Park, Maryland, United States of America, Aug.5-Aug.9 (2013).
+ K. Yamasue, M. Abe, Y. Sugimoto,and Y. Cho, Site specific measurement of surface potential shift on Si(111)-(7×7) surface by noncontact scanning nonlinear dielectric microscopy,15th International Conference on non-contact Atomic Force Microscopy,SYMPOSIUM AND CONTRIBUTED TALKS 51, University of Maryland, Colleage Park, Maryland, United States of America, Aug.5-Aug.9 (2013). 
+ D. Mizuno, K. Yamasue, and Y. Cho, Investigation of physical and electrical properties of hydrogen-adsorbed Si(111)-7×7 surface by using noncontact scanning nonlinear dielectric microscopy, 18th Microscopy of Semiconducting Materials Meeting ABSTRACTS, University of Oxford, United Kingdom, April 7-April 11(2013).
+ D. Mizuno, K. Yamasue, and Y. Cho, Atomic dipole moments on hydrogen-adsorbed Si(111)-7×7 surface observed by using noncontact scanning nonlinear dielectric microscopy, 20th International Colloquium on Scanning Probe Microscopy, S6-4, Dec. 18(2012).
+ N. Chinone, K Yamasue, Y Hiranaga,  K Honda, and Y Cho, Super higher order nonlinear dielectric microscopy with super high resolution, 2012 MRS Fall Meeting, Hynes Convention Center, Boston, Massachusetts, Nov. 25-30 (2012).
+ D. Mizuno, K. Yamasue, and Y. Cho, Non-contact scanning nonlinear dielectric microscopy studies of atomic dipole moments on hydrogen-adsorbed Si(111)-7×7 surface, Hynes Convention Center, Boston, Massachusetts, Nov. 25-30 (2012).
+ N. Chinone, K. Yamasue, Y. Hiranaga, K. Honda, and Y. Cho, Super-higher order nonlinear dielectric microscopy studies on ferroelectric materials and semiconductor devices, International Conference on Nanoscience + Technology, PO6.8, Paris, France, July 23-27 (2012).
+ D. Mizuno, K. Yamasue, and Y. Cho，Observation of dipole moments on hydrogen-adsorbed Si(111)-7×7 surface by non-contact scanning nonlinear dielectric microscopy，15th International Conference on non-contact Atomic Force Microscopy，17939, Český Krumlov，Czech republic，July 1-5 (2012).
+ K. Yamasue and Y. Cho，Simultaneous imaging of current and local dipole moments of Si (111)-(7×7) surface by noncontact scanning nonlinear dielectric microscopy，15th International Conference on non-contact Atomic Force Microscopy，17940, Český Krumlov，Czech republic，July 1-5 (2012).
+ N. Chinone, K. Yamasue, Y. Hiranaga, Y. Cho, Super higher-order nonlinear dielectric microscopy, 19th International Colloquium　on Scanning Probe Microscopy (ICSPM19), Toyako Manseikaku, Hokkaido, Japan, December 19-21 (2011).
+ K. Yamasue and Y. Cho, Observation of local dipole moments on cleaned Si(111) surface with defects by non-contact scanning nonlinear dielectric microscopy, 14th International Conference on non-contact Atomic Force Microscopy, Lindau, Germany, September 18-22(2011).
+ K. Yamasue, K. Kobayashi, H. Yamada, K. Matsushige, and T. Hikihara, Chaotic cantilever oscillation and its control in amplitude modulation atomic force microscopy, 2nd Multifrequency AFM Conference, Holiday Inn Madrid, Madrid, Spain, June 15-16 (2009).
+ K. Yamasue, K. Kobayashi, H. Yamada, K. Matsushige, and T. Hikihara, Control of chaotic sensor oscillation in dynamic-mode atomic force microscopy, The 5th International Conference on Nonlinear Science (Dynamics Days Asia Pacific 5), Nara, Japan, September 9-12 (2008).
+ K. Yamasue, K. Kobayashi, H. Yamada, K. Matsushige, and T. Hikihara, Experimental study on stabilization of chaotic cantilever oscillation in AM-AFM by time-delayed feedback control, 11th International Conference on Non-contact Atomic Force Microscopy (NCAFM-2008), HOTEL Rafael-Atocha, Madrid, Spain, September 16-19, (2008).
+ T. Tomita, K. Yamasue, and T. Hikihara, Parametric excitation of piezoelectric cantilevers based on elasticity control, 9th International Conference on Atomically Controlled Surfaces(ACSIN-9), Interfaces and Nanostructures, Komaba Research Campus of The University of Tokyo, Tokyo, Japan, November 11-15 (2007).
+ K. Yamasue and T. Hikihara, Improvement of transient response in non-contact atomic force microscopy: an application of time delayed feedback control, XXV Dynamics Days Europe 2005, Berlin, Germany, July 25-28, (2005).
+ K. Yamasue and T. Hikihara, Influence of remaining chaos on convergence of solutions in time delayed feedback controlled Duffing system, XXI International Congress of Theoretical and Applied Mechanics, Warsaw, Poland, August 15-21 (2004). 
+ T. Hikihara and K. Yamasue, A Study on domain of attraction in time-delayed feedback controlled Duffing system, Dynamics Days Europe 2002, Heidelberg, Germany, July 15-19 (2002). 

*Others [#y2decdec]
- [[Special symposium dynamics, chaos and control in atomic force microscopy, Ludwig-Maximilians-Universitat Munchen, Sep. 20 (2006):http://www.nanomanipulation.de/events/events.html]].
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