著書†

  1. K. Yamasue and T. Hikihara, Nonlinear dynamics in atomic force microscopy and its control for nanoparticle manipulation, in Nonlinear Dynamics of Nanosystems (2010, Wiley-VCH), Eds. by G. Radons, B. Rumpf, and H. G. Schuster, （共著，分担執筆）.
  2. T. Hikihara and K. Yamasue, Transient Dynamics of Duffing System under Time Delayed Feedback Control: Global Phase Structure and Application to Engineering, in Handbook of Chaos Control Second completely revised and enlarged edition (2007, Wiley-VCH), Eds. by E. Schöll and H. G. Schuster，(共著，分担執筆).
↑

解説論文 / 招待論文†

  1. K. Yamasue and Y. Cho, (in preparation)
  2. K. Yamasue and Y. Cho, Atomic resolution studies on surface dipoles by noncontact scanning nonlinear dielectric microscopy and potentiometry, in 2020 Joint Conference of the IEEE International Frequency Control Symposium and International Symposium on Applications of Ferroelectrics (IFCS-ISAF), Keystone, CO, USA (2020)
  3. 山末 耕平，茅根 慎通，長 康雄, 走査型非線形誘電率顕微鏡(SNDM)の紹介とその電子デバイス・材料評価への応用，電気学会誌 137(10), 697(2017)
  4. K. Yamasue, Atomic dipole imaging: NC-SNDM study on a hydrogen-terminated Si surface, Imaging & Microscopy 17(3), 43(2015).
  5. 山末 耕平，引原 隆士，遅延帰還を用いたダイナミックモード原子間力顕微鏡のカンチレバー振動の安定化，顕微鏡 45(2)，137 (2010).
  6. 山末 耕平，引原 隆士， 原子間力顕微鏡における制御応用とその展望，システム／制御／情報 53(6)，236 (2009).
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原著論文（査読有）†

  1. A. Sumiyoshi, K. Yamasue, Y. Cho, and J. Nakamura, (in preparation).
  2. K. Takano, K. Yamause, T. Kato, T. Kaneko, and Y. Cho (in preparation).
  3. K. Takano, K. Yamasue, and Y. Cho, (in preparation).
  4. K. Yamasue and Y. Cho, Local capacitance-voltage profiling and deep level transient spectroscopy of SiO2/SiC interfaces by scanning nonlinear dielectric microscopy, Microelectron. Reliab. 135, 114588 (2022).
  5. Y. Ogata, K. Yamasue, X. Zhang, T. Matsumoto, N. Tokuda, and Y. Cho, Microscopic evaluation of Al2O3/p-type diamond (111) interfaces using scanning nonlinear dielectric microscopy, Mater. Sci. Forum 1062, 298 (2022)
  6. K. Yamasue and Y. Cho, Surface potential fluctuations of SiO2/SiC interfaces investigated by local capacitance-voltage profiling based on time-resolved scanning nonlinear dielectric microscopy, Mater. Sci. Forum 1062, 335 (2022)
  7. K. Yamasue and Y. Cho, Boxcar averaging scanning nonlinear dielectric microscopy, Nanomaterials 12(5), 794 (2022).
  8. K. Suzuki, K. Yamasue, and Y. Cho, Nanoscale capacitance-voltage profiling of DC bias induced stress on a high-κ/SiO2/Si gate stack, Microelectron. Reliab. 126, 114278 (2021).
  9. K. Yamasue and Y. Cho, Local capacitance-voltage profiling and high voltage stress effect study of SiO2/SiC structures by time-resolved scanning nonlinear dielectric microscopy, Microelectron. Reliab. 126, 114284(2021).
  10. Jun Hirota, Kohei Yamasue, Yasuo Cho, Profiling of carriers in a 3D flash memory cell with nanometer-level resolution using scanning nonlinear dielectric microscopy, Microelectron. Reliab. 114, 113774 (2020).
  11. K. Yamasue and Y. Cho, Spatial scale dependent impact of non-uniform interface defect distribution on field effect mobility in SiC MOSFETs, Microelectron. Reliab. 114, 113829 (2020).
  12. K. Yamasue and Y. Cho, Nanoscale characterization of unintentional doping of atomically thin layered semiconductors by scanning nonlinear dielectric microscopy, J. Appl. Phys. 128(7), 074301 (2020).
  13. K. Yamasue, Y. Yamagishi, and Y. Cho, Influence of non-uniform interface defect clustering on field-effect mobility in SiC MOSFETs investigated by local deep level transient spectroscopy and device simulation, Mater. Sci. Forum 1004, 627-634(2020).
  14. J. Woerle, B. C. Johnson, C. Bongiorno, K. Yamasue, G. Ferro, D. Dutta, T. A. Jung, H. Sigg, Y. Cho, U. Grossner, and M. Camarda, The SiO2/4H-SiC Interface on Stepped Surfaces, Two-dimensional defect mapping of the SiO2/4H−SiC interface, Phys. Rev. Materials 3, 084602 (2019). [Editor's suggestion]
  15. K. Yamasue and Y. Cho, Optimization of signal intensity in intermittent contact scanning nonlinear dielectric microscopy, Microelectronics Reliability 100-101, 113345 (2019)
  16. K. Yamasue and Y. Cho, Local carrier distribution imaging on few-layer MoS2 exfoliated on SiO2 by scanning nonlinear dielectric microscopy, Appl. Phys. Lett. 112(24), 243102(2018).
  17. K. Yamasue, H. Fukidome, K. Tashima, M. Suemitsu, and Y. Cho, Graphene on C-terminated face of 4H-SiC observed by noncontact scanning nonlinear dielectric potentiometry, Jpn. J. Appl. Phys. 55(8S1), 08NB02 (2016).
  18. K. Yamasue and Y. Cho, Scanning nonlinear dielectric potentiometry, Rev. Sci. Instrum. 86(9), 093704 (2015).
  19. M. Suzuki, K. Yamasue, and Y. Cho, Experimental study of electric dipoles on an oxygen-adsorbed Si(100)-2×1 surface by non-contact scanning nonlinear dielectric microscopy, Appl. Phys. Lett. 107(3), 031604 (2015).
  20. K. Yamasue, H. Fukidome, K. Funakubo, M. Suemitsu, and Y. Cho, Interfacial charge states in graphene on SiC studied by noncontact scanning nonlinear dielectric potentiometry, Phys. Rev. Lett. 114(22), 226103 (2015).
  21. K. Yamasue, M. Abe, Y. Sugimoto, Y. Cho, Atomic-dipole-moment induced local surface potential on Si(111)-(7×7) surface studied by non-contact scanning nonlinear dielectric microscopy, Appl. Phys. Lett. 105(12), 121601 (2014).
  22. M. Suzuki, K. Yamasue, M. Abe, Y. Sugimoto, and Y. Cho, Improved study of electric dipoles on the Si(100)-2×1 surface by non-contact scanning nonlinear dielectric microscopy, Appl. Phys. Lett. 105(10), 101603 (2014).
  23. N. Chinone, K. Yamasue, K. Honda, Y. Cho, High resolution imaging in cross-section of a metal-oxide-semiconductor field-effect-transistor using super-higher-order nonlinear dielectric microscopy, J. Phys.: Conf. Ser. 471(1), 012023(2013).
  24. D. Mizuno, K. Yamasue, Y. Cho, Atomic dipole moment distribution on a hydrogen-adsorbed Si(111)-(7×7) surface observed by noncontact scanning nonlinear dielectric microscopy, Appl. Phys. Lett. 103(10), 101601(2013).
  25. K. Yamasue and Y. Cho, Simultaneous measurement of tunneling current and atomic dipole moment on Si(111)-(7×7) surface by noncontact scanning nonlinear dielectric microscopy, J. Appl. Phys. 113(1), 014307(2013).
  26. N. Chinone, K. Yamasue, Y. Hiranaga, K. Honda, and Y. Cho, Lateral resolution improvement in scanning nonlinear dielectric microscopy by measuring super-higher-order nonlinear dielectric constants, Appl. Phys. Lett. 101(21), 213112 (2012).
  27. N. Sawai, K. Yamasue, Y. Cho, Atomic scale imaging of TiO2(100) reconstructed surfaces by non-contact scanning nonlinear dielectric microscopy, Jpn. J. Appl. Phys. 51, 121801 (2012).
  28. N. Chinone, K. Yamasue, Y. Hiranaga, and Y. Cho, Observation of nanoscale ferroelectric domains using super higher-order nonlinear dielectric microscopy, Jpn. J. Appl. Phys. 51(9), 09LE07(2012).
  29. K. Yamasue and Y. Cho, Observation of polarization distribution on Si(111) surface by scanning nonlinear dielectric microscopy, Jpn. J. Appl. Phys. 50(9), 09NE12(2011).
  30. K. Yamasue, K. Kobayashi, H. Yamada, K. Matsushige, and T. Hikihara, Controlling chaos in dynamic-mode atomic force microscope, Phys. Lett. A 373(35), 3140 (2009).
  31. K. Yamasue and T. Hikihara, Control of microcantilevers in dynamic force microscopy using time delayed feedback, Rev. Sci. Instrum. 77(5), 053703 (2006).
  32. K. Yamasue and T. Hikihara, Persistence of chaos in a time-delayed-feedback controlled Duffing system, Phys. Rev. E 73(3), 036209 (2006).
  33. K. Yamasue and T. Hikihara, Domain of attraction for stabilized orbits in time delayed feedback controlled Duffing systems, Phys. Rev. E 69(5), 056209 (2004).
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国際会議論文（査読有）†

  1. K. Yamasue, Y. Ogata, T. Matsumoto, N. Tokuda, and Y. Cho, Nanoscale fluctuation analysis on capacitance-voltage profiles of Al2O3/diamond by time-resolved scanning nonlinear dielectric microscopy, The 43th Annual NANO Testing Symposium (NANOTS2023), 26-30, Senri Life-Science Center, Toyonaka, Japan, Nov. 7-9 (2023).
  2. K. Yamasue and Y. Cho, Correlation analysis on local capacitance-voltage profiles of a SiO2/SiC interface observed by time-resolved scanning nonlinear dielectric microscopy, 7th IEEE Electron Devices Technology and Manufacturing (EDTM) Conference 2023, 645-647, COEX, Seoul, Korea, March 6-9 (2023)
  3. K. Yamasue and Y. Cho, Nanoscale fluctuation analysis on capacitance-voltage profiles of SiO2/SiC by time-resolved scanning nonlinear dielectric microscopy, The 42th Annual NANO Testing Symposium (NANOTS2022), 31-35, online, Nov. 8-10(2022).
  4. T. Ishizuka, K. Yamasue, and Y. Cho, Local Capacitance-voltage profiling on MoS2/SiO2 and MoS2/h-BN/SiO2 by scanning nonlinear dielectric microscopy assisted with an insulating tip, 6th IEEE Electron Devices Technology and Manufacturing (EDTM) Conference 2022, 223-225, virtual, March 6-9(2022)
  5. K. Yamasue and Y. Cho, Visualization of nanoscale carrier dynamics at SiO2/SiC interfaces by time-resolved scanning nonlinear dielectric microscopy, The 41th Annual NANO Testing Symposium (NANOTS2021), 21-26, online, Oct. 25-27(2021).
  6. K. Suzuki, K. Yamasue, Y. Cho, Measurement of local capacitance-voltage characteristics on high-κ/SiO2/Si under DC bias stress using time-resolved scanning nonlinear dielectric microscopy, The 41th Annual NANO Testing Symposium (NANOTS2021), 116-121, online, Oct. 25-27(2021).
  7. Y. Ogata, K. Yamasue, X. Zhang, T. Matsumoto, N. Tokuda, and Y. Cho, Nanoscale study of interface defect density evaluation at diamond MOS interfaces using time-resolved scanning nonlinear dielectric microscopy, The 41th Annual NANO Testing Symposium (NANOTS2021), 110-115, online, Oct. 25-27(2021).
  8. K. Yamasue and Y. Cho, Simultaneous interface defect density and differential capacitance imaging by time-resolved scanning nonlinear dielectric microscopy, Proceedings from the 47th International Symposium for Testing and Failure Analysis, 441-445, Phoenix Convention Center, Phoenix, Arizona, USA, Oct. 31-Nov. 4 (2021).
  9. K. Yamasue and Y. Cho, Local capacitance-voltage profiling and deep level transient spectroscopy of SiO2/SiC interfaces by scanning nonlinear dielectric microscopy, 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Sep. 14 - Oct. 13, virtual (2021).
  10. K. Yamasue, and Y. Cho, Improvement of signal-to-noise ratio in semiconductor carrier distribution imaging by intermittent scanning nonlinear dielectric microscopy,The 39th Annual NANO Testing Symposium (NANOTS2019), 130-134, KFC Hall, Kokusai Fashion Center, Tokyo, Japan, Nov. 18–19 (2019).
  11. A. Hosaka, K. Yamasue, J. Woerle, G. Ferro,U. Grossner, M. Camarda, and Y. Cho, Evaluation of interface defect density distribution on macrostepped SiO2/SiC by time-resolved local deep level transient spectroscopy, The 39th Annual NANO Testing Symposium (NANOTS2019), 75-79, KFC Hall, Kokusai Fashion Center, Tokyo, Japan, Nov. 18–19 (2019).
  12. K. Takano, K. Yamasue, and Y. Cho, Development of cantilevers with insulating coating for semiconductor carrier distribution imaging using scanning nonlinear dielectric microscopy and its application to layered semiconductors, The 39th Annual NANO Testing Symposium (NANOTS2019), 135-140, KFC Hall, Kokusai Fashion Center, Tokyo, Japan, Nov. 18–19 (2019).
  13. A. Hosaka, K. Yamasue, J. Woerle, G. Ferro,U. Grossner, M. Camarda, and Y. Cho, Spatially-resolved evaluation of interface defect density on macrostepped SiO2/SiC using local deep level transient spectroscopy, 2019 International Integrated Reliability Workshop (IIRW) (2019)
  14. K. Suzuki, K. Yamasue, Y. Cho, A study on evaluation of interface defect density on high-κ/SiO2/Si and SiO2/Si gate stacks using scanning nonlinear dielectric microscopy, 2019 International Integrated Reliability Workshop (IIRW) (2019)
  15. K. Yamasue and Y. Cho, Boxcar averaging based scanning nonlinear dielectric microscopy and its application to carrier distribution imaging on 2D semiconductors, 2019 International Integrated Reliability Workshop (IIRW) (2019)
  16. K. Yamasue and Y. Cho, Unintentional doping effects on atomically-thin Nb-doped MoS2 observed by scanning nonlinear dielectric microscopy, Proceedings from the 45th International Symposium for Testing and Failure Analysis, 498-503, Nov. 10-14, Portland, Oregon USA (2019).
  17. K. Yamasue and Y. Cho, Improved signal intensity in carrier distribution imaging of few-layer MoS2 by scanning nonlinear dielectric microscopy, The 38th Annual NANO Testing Symposium (NANOTS2018), 196-199, KFC Hall, Kokusai Fashion Center, Tokyo, Japan, Nov. 19–20 (2018).
  18. K. Yamasue and T. Hikihara, Suppression of subharmonics and chaos in tapping mode atomic force microscopy using time delayed feedback control, 2006 International Symposium on Nonlinear Theory and its Applications, 927-930, Bologna, Italy, September 11-14 (2006).
  19. K. Yamasue and T. Hikihara, A study on vibration characteristics of microcantilever probe near period-doubling bifurcation, Proceedings of the 2005 International Symposium on Nonlinear Theory and its Applications, 582-585, SEC@BRUGES, Bruges, Belgium, October 18-21 (2005).
  20. K. Yamasue and T. Hikihara, Annihilation of periodic orbits in time delayed feedback controlled systems, Proceedings of the 2005 International Symposium on Nonlinear Theory and its Applications, 162-165, SEC@BRUGES, Bruges, Belgium, October 18-21 (2005).
  21. T. Hikihara and K. Yamasue, A Numerical Study on Suspension of Molecules by Microcantilever Probe, Proceedings of the Fifth International Symposium on Linear Drives for Industry Applications (LDIA2005), 29-32, Awaji, Hyogo, September 25-28 (2005).
  22. K. Yamasue and T. Hikihara, A study on multiple steady states and their relation to global structure in time delayed feedback controlled Duffing System, Proceedings of the 2004 International Symposium on Nonlinear Theory and its Applications, 259-262, Fukuoka, Japan, November 29 - December 3 (2004).
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招待講演／依頼講演†

  1. 山末 耕平, 時間分解SNDM を⽤いた次世代半導体材料のナノスケール電荷状態観察，次世代ナノプローブ技術委員会，第2回研究会，Shimadzu Tokyo Innovation Plaza, 川崎市，March 12 (2024).
  2. 山末 耕平, 走査型非線形誘電率顕微鏡の次世代パワーエレクトロニクス材料評価への応用，名古屋大学VBLシンポジウム「GaNパワーデバイスの社会実装に向けた評価と技術」，名古屋大学, Nov. 30 (2023).
  3. 山末 耕平, 走査型非線形誘電率顕微鏡の原理と半導体ナノスケール物性評価への応用，電気化学会電子材料委員会 第86回半導体・集積回路技術シンポジウム, オンライン，August 30-31 (2022).
  4. 山末 耕平, 時間分解SNDMを用いた半導体のナノスケール評価に関する最近の展開, ISSP workshop/東京大学物性研究所短期研究会，"Frontier of scanning probe microscopy and related nano science”「機能的走査プローブ顕微鏡の新展開」, オンライン, March 30-31(2022).
  5. Jun Hirota, Ken Hoshino, Kohei Yamasue, and Yasuo Cho, Carrier profile mapping in a 3D flash memory cell using scanning nonlinear dielectric microscopy, 8D-RE2-4, 6th IEEE Electron Devices Technology and Manufacturing (EDTM) Conference 2022, Oita, Japan, March 6-9 (2022).
  6. K. Yamasue and Y. Cho, Nanoscale characterization techniques for ultra-thin van der Waals semiconductors based on scanning nonlinear dielectric microscopy, The 5th international symposium on “Elucidation of Next Generation Functional Materials, Surface and Interface Properties", Osaka University, Osaka, Japan, Oct. 7-9(2021).
  7. 長 康雄，山末 耕平，SNDM の半導体応用に関する新技術－時間分解SNDM による界面欠陥準位の可視化と絶縁膜付き探針を用いた層状構造半導体の観察－，日本学術振興会 産学協力研究委員会，ナノプローブテクノロジー第167委員会, Nov. 26th (2020).
  8. K. Yamasue and Y. Cho, Atomic resolution studies on surface dipoles by noncontact scanning nonlinear dielectric microscopy and potentiometry, Joint Conference of the IEEE International Frequency Control Symposium & IEEE International Symposium on Applications of Ferroelectrics, Keystone, Colorado, USA, July 19-23 (2020).[Virtual conference due to covid19]
  9. K. Yamasue and Y. Cho, Nanoscale carrier distribution imaging on atomically-thin layered semiconductors by scanning nonlinear dielectric microscopy, The 4th international symposium on “Elucidation of Property of Next Generation Functional Materials and Surface/Interface, Alumnus Union Building of Osaka University Medical School, Osaka University, Dec. 9-10(2019）
  10. 山末 耕平，原子分解能を持つ非接触走査型非線形誘電率顕微鏡の研究，日本顕微鏡学会 超高空間分解能SPMの最前線，大阪大学東京オフィス，Feb. 1(2019)
  11. 山末 耕平，原子分解能を有する非接触走査型非線形誘電率顕微鏡を用いた表面研究，2018年日本表面真空学会学術講演会 プローブ顕微鏡研究部会「プローブ顕微鏡による表面研究の最前線」1Fp08，神戸国際会議場，Nov. 19-21(2018)
  12. 長 康雄，茅根 慎通，廣瀬 光太郎，山末 耕平，超高次走査型非線形誘電率顕微鏡法による次世代パワー半導体デバイスの評価と走査型非線形誘電率ポテンショメトリの提案，2015年 第76回応用物理学会秋季学術講演会 15p-2H-4，名古屋国際会議場,Sep.13-16(2015).
  13. 山末 耕平，時間遅れフィードバックを用いたカオス制御系の力学構造について，同期現象と周期軌道の安定化に関するシンポジウム，京都大学 吉田キャンパス，March 9-10 (2007).
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国際会議†

  1. (2024)
  2. (2024)
  3. A. Sumiyoshi, K. Yamasue, Y. Cho, and J. Nakamura, A simulation for the in-plane distribution of the surface dipole moment using DFT calculations, 31st International Colloquium on Scanning Probe Microscopy (ICSPM31), S7-2, Tokyo Institute of Technology, Tokyo, Japan, Dec. 7-8 (2023).
  4. K. Yamasue, Y. Ogata, T. Matsumoto, N. Tokuda, and Y. Cho, Local capacitance-voltage profiling of Al2O3/OH-diamond (111) by scanning nonlinear dielectric microscopy, 2023 MRS Fall Meeting & Exhibit, CH01.09.03, Boston, Massachusetts, USA, Nov. 26-Dec. 1 (2023).
  5. K. Yamasue and Y. Cho, Nanoscale fluctuation analysis on capacitance-voltage profiles of semiconductors by time-resolved scanning nonlinear dielectric microscopy, 2023 MRS Fall Meeting & Exhibit. CH01.08.32, Boston, Massachusetts, USA, Nov. 26-Dec. 1 (2023).
  6. K. Yamasue, K. Ueno, T. Kondo, R. Tanaka, S. Takashima, and Y. Cho, Microscopic evaluation of SiO2/GaN interface for power device applications by scanning nonlinear dielectric microscopy, 14th International Conference on Nitride Semiconductors (ICNS-14), ThP-CH-22, Hilton Fukuoka Sea Hawk, Fukuoka, Japan, Nov. 12-17 (2023).
  7. A. Sumiyoshi, K. Yamasue, Y. Cho, and J. Nakamura, Visualization of the local dipole moment at the Si(111)-(2x2) surface using DFT calculations, AVS 69th International Symposium & Exibition (AVS69), SS+AS+TF-MoA-4, Oregon Convention Center, Portland, USA, Nov. 5-10 (2023).
  8. K. Takano, K. Yamasue, T. Kato, T. Kaneko, and Y. Cho, Carrier distribution in mechanically exfoliated WSe2/SiO2 and suspended WSe2 measured by scanning nonlinear dielectric microscopy, 34th European Conference on Surface Science (ECOSS34), Thu-15:00-O-2DM, Vienna House Andel's hotel, Lodz, Poland, Aug. 28 - Sep. 1 (2023).
  9. K. Yamasue and Y. Cho, Correlation analysis on local capacitance-voltage profiles of a SiO2/SiC interface observed by time-resolved scanning nonlinear dielectric microscopy, 7th IEEE Electron Devices Technology and Manufacturing (EDTM) Conference 2023, 49A-4, COEX, Seoul, Korea, March 6-9 (2023).
  10. K. Takano, K. Yamasue, T. Kato, T. Kaneko, and Y. Cho, Scanning nonlinear dielectric microscopic investigation of mechanically exfoliated WSe2/SiO2 and suspended WSe2, 2022 MRS Fall Meeting & Exhibit, NM02.10.18, Boston, Massachusetts, USA, Nov. 27-Dec. 2 (2022).
  11. K. Yamasue, Y. Ando, M. Deki, H. Amano, and Y. Cho, Real-space analysis on surface potential fluctuations of Al2O3/GaN interfaces by scanning nonlinear dielectric microscopy,International Workshop on Nitride Semiconductors (IWN2022), PP 323, Berlin, Germany, Oct. 9-14 (2022).
  12. K. Takano, K. Yamasue, T. Kato, T. Kaneko, and Y. Cho, Comparative study on carrier distribution of mechanically exfoliated WSe2/SiO2 and suspended WSe2 by scanning nonlinear dielectric microscopy, The 22nd International Vacuum Congress (IVC-22), Mon-J1-4, Sapporo Convention Center, Sapporo, Japan, Sep. 11-16 (2022).
  13. T. Ishizuka, K. Yamasue, and Y. Cho, Local Capacitance-voltage profiling on MoS2/SiO2 and MoS2/h-BN/SiO2 by scanning nonlinear dielectric microscopy assisted with an insulating tip, 6th IEEE Electron Devices Technology and Manufacturing (EDTM) Conference 2022, 5C-MA1-4, virtual, March 6-9(2022)
  14. Y. Ogata, K. Yamasue, X. Zhang, T. Matsumoto, N. Tokuda, and Y. Cho, A scanning nonlinear dielectric microscopic investigation of al2O3/diamond MOS interfaces, 2021 MRS Fall Meeting & Exhibit, EQ19.07.03, Boston, Massachusetts, USA, Nov. 29-Dec. 2 (2021).
  15. K. Yamasue and Y. Cho, Microscopic carrier distribution imaging of atomically-thin van der Waals semiconductors by scanning nonlinear dielectric microscopy, 2021 MRS Fall Meeting & Exhibit, EQ20.12.01, Boston, Massachusetts, USA, Nov. 29-Dec. 2 (2021).
  16. K. Yamasue and Y. Cho, Surface potential fluctuations of SiO2/SiC interfaces investigated by local capacitance-voltage profiling based on time-resolved scanning nonlinear dielectric microscopy, The 13th European Conference on Silicon Carbide and Related Materials (ECSCRM 2020·2021), We-2B-01, Vinci International Convention Centre/virtual(hybrid), Tours, France, Oct. 24-28 (2021).
  17. Y. Ogata, K. Yamasue, X. Zhang, T. Matsumoto, N. Tokuda, and Y. Cho, Nanoscale evaluation of Al2O3/diamond MOS interfaces using time-resolved scanning nonlinear dielectric microscopy, The 13th European Conference on Silicon Carbide and Related Materials (ECSCRM 2020·2021), We-1B-03, Vinci International Convention Centre/virtual(hybrid), Tours, France, Oct. 24-28 (2021).
  18. K. Yamasue and Y. Cho, Local capacitance-voltage profiling and high voltage stress effect study of SiO2/SiC structures by time-resolved scanning nonlinear dielectric microscopy, 32th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis(ESREF2021), B1-4#53, Bordeaux, France, virtual, Oct. 4-7 (2021).
  19. K. Suzuki, K. Yamasue, Y. Cho, Nanoscale capacitance-voltage profiling of DC bias induced stress on a high-κ/SiO2/Si gate stack, 32th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis(ESREF2021), BP-2#5, Bordeaux, France, virtual, Oct. 4-7 (2021).
  20. K. Yamasue and Y. Cho, Nanoscale analysis of unintentional p- to n-type transition on ultrathin MoS2 layers, 2021 International Conference on Nanoscience + Technology (ICN+T 2021), virtual, July 12-15 (2021).
  21. K. Suzuki, K. Yamasue, and Y. Cho, Nanoscale capacitance-voltage characteristics measurement of a high-κ/SiO2/Si gate stack effected by DC bias stress, 2021 International Conference on Nanoscience + Technology (ICN+T 2021), virtual, July 12-15 (2021).
  22. K. Takano, K. Yamasue, T. Kato, T. Kaneko, and Y. Cho, Nanoscale comparative study of electric field effects in atomically-thin WSe2 on SiO2 and suspended WSe2, 2021 International Conference on Nanoscience + Technology (ICN+T 2021), virtual, July 12-15 (2021).
  23. K. Yamasue and Y. Cho, Local capacitance-voltage profiling and deep level transient spectroscopy of SiO2/SiC interfaces by scanning nonlinear dielectric microscopy, The 28th edition of the IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2021), D1.5, Sep. 14-Oct. 13, virtual (2021).
  24. K. Takano, K. Yamasue, T. Kato, T. Kaneko, Y. Cho, Nanoscale comparison of bias dependent carrier distributions in mechanically exfoliated WSe2/SiO2 and suspended WSe2 by scanning nonlinear dielectric microscopy, 51st IEEE Semiconductor Interface Specialists Conference (SISC), Virtual conference, Dec. 16-19 (2020).
  25. K. Suzuki, K. Yamasue, and Y. Cho, Nanoscale evaluation of DC bias stress induced interface defect density of a high-κ/SiO2/Si gate stacks using time-resolved scanning nonlinear dielectric microscopy, 51st IEEE Semiconductor Interface Specialists Conference (SISC), Virtual conference, Dec. 16-19 (2020).
  26. K. Yamasue and Y. Cho,Microscopic capacitance-voltage characteristics measurement of a SiO2/SiC MOS structure by time-resolved scanning nonlinear dielectric microscopy, Virtual conference, Dec. 16-19 (2020).
  27. J. Hirota, K. Hoshino, T. Nakai, K. Yamasue, and Y. Cho, Carrier profiling of the 10-nm-order structure in a 3D Flash memory cell using scanning nonlinear dielectric microscopy, the 45th International Symposium for Testing and Failure Analysis (ISTFA 2019), Portland, Oregon, USA, November 10-14 (2019)
  28. A. Hosaka, K. Yamasue, J. Woerle, G. Ferro,U. Grossner, M. Camarda, and Y. Cho, Spatially-resolved evaluation of interface defect density on macrostepped SiO2/SiC using local deep level transient spectroscopy,IEEE International Integrated Reliability Workshop (IIRW), Stanford Sierra Conference Center Fallen Leaf Lake, CA, USA, October 13-17 (2019)
  29. K. Suzuki, K. Yamasue, and Y. Cho, A study on evaluation of interface defect density on high-κ/SiO2/Si and SiO2/Si gate stacks using scanning nonlinear dielectric microscopy, IEEE International Integrated Reliability Workshop (IIRW), Stanford Sierra Conference Center Fallen Leaf Lake, CA, USA, October 13-17 (2019).
  30. K. Yamasue and Y. Cho, Boxcar averaging based scanning nonlinear dielectric microscopy and its application to carrier distribution imaging on 2D semiconductors, IEEE International Integrated Reliability Workshop (IIRW), Stanford Sierra Conference Center Fallen Leaf Lake, CA, USA, October 13-17 (2019)
  31. K. Yamasue and Y. Cho, Unintentional n-type doping on single layer Nb-doped MoS2 observed by scanning nonlinear dielectric microscopy(submited).// 2019 MRS fall meeting and exhibit
  32. J. Woerle, B. C. Johnson, C. Bongiorno, K. Yamasue, G. Ferro, D. Dutta, Y. Cho, U. Grossner and M. Camarda, Spatially Resolved Defect Mapping of the SiO2/4H-SiC Interface,the International Conference on Silicon Carbide and Related Materials 2019 (ICSCRM 2019) We-2A-05, Kyoto International Conference Center, Kyoto, Japan, September 29 - October 4 (2019).
  33. K. Yamasue, Y. Yamagishi, and Y. Cho, Influence of non-uniform interface defect distribution on channel mobility in SiC MOSFETs investigated by local deep level transient spectroscopy and device simulation, the International Conference on Silicon Carbide and Related Materials 2019 (ICSCRM 2019) Tu-3A-05, Kyoto International Conference Center, Kyoto, Japan, September 29 - October 4 (2019).
  34. K. Yamasue and Y. Cho, Optimization of signal intensity in intermittent contact scanning nonlinear dielectric microscopy, the 30th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis(ESREF 2019), Centre de Congrès Pierre Baudis, Toulouse, France, Sep. 23-26 (2019).
  35. K. Yamasue and Y. Cho, Improvement of signal-to-noise ratio in carrier distribution imaging in intermittent contact scanning nonlinear dielectric microscopy based on boxcar integration, 18th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVIII) 5.5-O, September 8-12, Berlin, Germany (2019).
  36. K. Yamasue and Y. Cho, Unintentional doping effects on atomically-thin Nb-doped MoS2 observed by scanning nonlinear dielectric microscopy, the 45th International Symposium for Testing and Failure Analysis (ISTFA 2019), Portland, Oregon, USA, November 10-14 (2019)
  37. K. Yamasue and Y. Cho, Surface dipole induced potentials on metals observed by noncontact scanning nonlinear dielectric potentiometry, The 17th International Conference on the Formation of Semiconductor Interfaces (ICFSI-17), Shanghai Tianping Hotel, Shanghai, China, June 24-28 (2019).
  38. K. Yamasue, T. Kato, T. Kaneko, and Y. Cho, Electric Field Effects on Few-Layer WSe2/SiO2 Investigated by Scanning Nonlinear Dielectric Microscopy, 2018 MRS Fall Meeting & Exhibit, EP03.01.11, Boston, Massachusetts, November 25-30 (2018).
  39. K. Yamasue, T. Kato, T. Kaneko, and Y. Cho, Few-layer WSe2 on SiO2 observed by scanning nonlinear dielectric microscopy and electrostatic force microscopy, 14th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN-14) in conjunction with 26th International Colloquium on Scanning Probe Microscopy (ICSPM26) 22P090, Sendai International Center, Sendai, Japan, Oct. 21 - 25 (2018).
  40. K. Yamasue, T. Kato, T. Kaneko, and Y. Cho, DC bias dependent nanoscale carrier distribution on a few-layer WSe2 on SiO2 observed by scanning nonlinear dielectric microscopy, 34th European Conference on Surface Science (ECOSS34), 2DM-CT-WED-37, Scandinavian Congress Centre, Aarhus, Denmark, Aug. 26 - 31 (2018).
  41. K. Yamasue, T. Kato, T. Kaneko, and Y. Cho, Scanning nonlinear dielectric microscopy study on nanoscale carrier distribution in two-dimensional semiconductors, 2018 International Conference on Nanoscience + Technology (ICN+T 2018) TuA09, BVV Trade Fairs, Brno, Czech Republic, July 22 – 27(2018).
  42. K. Yamasue and Y. Cho, Scanning nonlinear dielectric microscopy in peak-force tapping mode and its application to transition metal dichalcogenides, International Scanning Probe Microscopy 2018 (ISPM2018) Session VIII-2, Arizona State University, Tempe Campus, Tempe, Arizona, USA, May 8-11(2018).
  43. K. Yamasue and Y. Cho, Nanoscale carrier distribution imaging of layered semiconductor materials using scanning nonlinear dielectric microscopy, 45th Conference on the Physics and Chemistry of Surfaces and Interfaces (PCSI-45), PCSI-TuM7, Sheraton Kona Resort & Spa, Kona, Hawaii, USA, Jan. 14 - Jan. 18 (2018).
  44. K. Yamasue and Y. Cho, Local carrier distribution imaging of two-dimensional semiconductors by scanning nonlinear dielectric microscopy, 25th International Colloquium on Scanning Probe Microscopy (ICSPM25), S8-4, Atagawa Heights, Shizuoka, Japan, Dec. 7 - Dec. 9 (2017).
  45. K. Yamasue and Y. Cho, Local carrier and charge distribution imaging on molybdenum disulfide by scanning nonlinear dielectric microscopy, The 8th International Symposium on Surface Science (ISSS-8), 4aC2-2, Tsukuba International Congress Center, Tsukuba, Japan, Oct. 22 - Oct. 26 (2017)
  46. K. Yamasue and Y. Cho, Atomic resolution imaging and carrier type determination of molybdenum disulfide by noncontact scanning nonlinear dielectric microscopy, 33rd European Conference on Surface Science (ECOSS-33), Thu‑9:40‑O‑SAMA, Szeged, Hungary, Aug. 27 - Sep. 1(2017).
  47. K. Yamasue and Y. Cho, Atomic resolution imaging of MoS2 by noncontact scanning nonlinear dielectric microscopy, The 19th International Scanning Probe Microscopy Conference, WeB-2, Kyoto International Community House, Kyoto, Japan, May 16 - May 19 (2017).
  48. K. Yamasue and Y. Cho, Polarization charge density measurement by noncontact scanning nonlinear dielectric potentiometry, 24th International Colloquium on Scanning Probe Microscopy (ICSPM24), S2-5, Hawaii Convention Center, Honolulu, United States of America, Dec. 14 - Dec. 16 (2016).
  49. K. Yamasue and Y. Cho, Surface polarization on a Si(111) reconstructed surface measured by noncontact scanning nonlinear dielectric potentiometry, 32nd European Conference on Surface Science, O12-ELPS_111, Alpexpo, Grenoble, France, Aug. 28 - Sep. 2(2016).
  50. K. Yamasue and Y. Cho, Surface polarization measurement on a reconstructed Si(111) surface by noncontact scanning nonlinear dielectric potentiometry, 19th International Conference on Non-Contact Atomic Force Microscopy, P:09, East Midlands, Conference Centre, Nottingham, United Kingdom, July 25-29 (2016).
  51. K. Yamasue, H. Fukidome, K. Tashima, M. Suemitsu, and Y. Cho, Graphene on C-terminated Face of 4H-SiC Observed by Noncontact Scanning Nonlinear Dielectric Potentiometry, 23rd International Colloquium on Scanning Probe Microscopy (ICSPM23), S2-1, Hilton Niseko Villege, Hokkaido, Japan, Dec. 10 - Dec. 12 (2015).
  52. K. Yamasue, H. Fukidome, K. Funakubo, M. Suemitsu, and Y. Cho, Simultaneous imaging of atomically resolved topography and potential of graphene on C-terminated face of SiC using scanning nonlinear dielectric potentiometry, 2015 MRS Fall Meeting & Exhibit, Q3.65, Hynes Convention Center, Boston, Massachusetts, Nov. 29 - Dec. 4 (2015).
  53. M. Suzuki, K. Yamasue, and Y. Cho, Investigation of oxygen adsorbed Si(100)-(2x1) surface using noncontact scanning nonlinear dielectric microscopy, 2015 MRS Fall Meeting & Exhibit, UU8.07, Hynes Convention Center, Boston, Massachusetts, Nov. 29 - Dec. 4 (2015).
  54. K. Yamasue, H. Fukidome, K. Tashima, K. Funakubo, M. Suemitsu, and Y. Cho, Observation of graphene on C-terminated face of SiC using noncontact scanning nonlinear dielectric potentiometry , 18th International Conference on non contact Atomic Force Microscopy, P-Wed-37, Oustau Calendal, Cassis, France, Sep. 7 -11 (2015).
  55. M. Suzuki, K. Yamasue, and Y. Cho, Oxygen adsorption on a Si(100)-(2x1) surface studied by noncontact scanning nonlinear dielectric microscopy, 18th International Conference on non contact Atomic Force Microscopy, P-Wed-40, Oustau Calendal, Cassis, France, Sep. 7 -11 (2015).
  56. K. Yamasue, H. Fukidome, K. Tashima, K. Funakubo, M. Suemitsu, and Y. Cho, Graphene on C-terminated face of 4H-SiC studied by noncontact scanning nonlinear dielectric potentiometry, The 31st European Conference on Surface Science (ECOSS-31), Th-A21, International Convention Center of Barcelona, Barcelona, Spain, Aug. 31 - Sep. 4 (2015).
  57. M. Suzuki, K. Yamasue, and Y. Cho, Non-contact scanning nonlinear dielectric microscopy study of oxygen-adsorption on a Si(100)-(2x1) surface, The 31st European Conference on Surface Science (ECOSS-31), P-Th-040, International Convention Center of Barcelona, Barcelona, Spain, Aug. 31 - Sep. 4 (2015).
  58. Y. Cho and K. Yamasue, Scanning nonlinear dielectric potentiometry: new strategy for measuring dipole-induced potentials in atomic scale, International Scanning Probe Microscopy Conference Rio 2015, PT.03, the Ferradura Hotel, Rio De Janeiro, Brazil, June 21-24 (2015).
  59. Y. Cho, K. Yamasue, H. Fukidome, K. Funakubo, and M. Suemitsu, Hydrogen-intercalated graphene on SiC studied by noncontact scanning nonlinear dielectric potentiometry, International Scanning Probe Microscopy Conference Rio 2015, OP.12, the Ferradura Hotel, Rio De Janeiro, Brazil, June 21-24 (2015).
  60. K. Yamasue, H. Fukidome, K. Funakubo, M. Suemitsu, and Y. Cho, Comparative study on pristine and hydrogen-intercalated graphene on 4H-SiC(0001) surface using noncontact scanning nonlinear dielectric microscopy, 2014 MRS Fall Meeting & Exhibit, K6.01, Hynes Convention Center, Boston, Massachusetts, Dec. 1-5 (2014).
  61. K. Yamasue and Y. Cho, Dipole-induced potential measurement using noncontact scanning nonlinear dielectric microscopy, 2014 MRS Fall Meeting & Exhibit, PP2.07 Hynes Convention Center, Boston, Massachusetts, Dec. 1-5 (2014).
  62. M. Suzuki, K. Yamasue, M. Abe, Y. Sugimoto, and Y. Cho, Simultaneous observation of topography and electric dipole moments on Si(100)-2×1 surface using non-contact scanning nonlinear dielectric microscopy, 2014 MRS Fall Meeting & Exhibit, PP2.06 Hynes Convention Center, Boston, Massachusetts, Dec. 1-5 (2014).
  63. M. Suzuki, K. Yamasue, M. Abe, Y. Sugimoto, and Y. Cho, Investigation of electric dipole moments on Si(100)-2×1 surface using non-contact scanning nonlinear dielectric microscopy, The European Conference on Surface Science, Antalya, Turkey, August 31- September 5, (2014).
  64. K. Yamasue and Y. Cho, A new atomically resolved potentiometry for dipole-induced local surface potential based on noncontact scanning nonlinear dielectric microscopy, The European Conference on Surface Science, Antalya, Turkey, August 31- September 5, (2014).
  65. K. Yamasue, H. Fukidome, K. Funakubo, M. Suemitsu, and Y. Cho, Investigation of hydrogen-intercalated graphene on 4H-SiC(0001) by noncontact scanning nonlinear dielectric microscopy, The European Conference on Surface Science, Antalya, Turkey, August 31- September 5, (2014).
  66. M. Suzuki, K. Yamasue, M. Abe, Y. Sugimoto, and Y. Cho, Observation of electric dipole moments on Si(100)-2×1 surface by using non-contact scanning nonlinear dielectric microscopy, 17th International Conference on non-contact Atomic Force Microscopy, Tsukuba, Japan, August 4-8 (2014).
  67. K. Yamasue and Y. Cho, Surface potentiometry based on scanning nonlinear dielectric microscopy, 17th International Conference on non-contact Atomic Force Microscopy, Tsukuba, Japan, August 4-8 (2014).
  68. K. Yamasue, H. Fukidome, K. Funakubo, M. Suemitsu, and Y. Cho, Noncontact scanning nonlinear dielectric microscopy study of graphene on 4H-SiC(0001) and its hydrogen-intercalation, 17th International Conference on non-contact Atomic Force Microscopy, Tsukuba, Japan, August 4-8 (2014).
  69. M. Suzuki, K. Yamasue, M. Abe, Y. Sugimoto, Y. Cho, Study of electric dipole moment distribution on Si(100)-2×1 surface by non-contact scanning nonlinear dielectric microscopy, 2014 International Conference on Nanoscience + Technology, Vail, Colorado, USA, July 20-25 (2014).
  70. K. Yamasue and Y. Cho, A novel method for simultaneous measurement of topography and dipole-induced local surface potential based on noncontact scanning nonlinear dielectric microscopy, 2014 International Conference on Nanoscience + Technology, Vail, Colorado, USA, July 20-25 (2014).
  71. K. Yamasue, H. Fukidome, K. Funakubo, M. Suemitsu, and Y. Cho, High-resolution imaging of hydrogen-intercalated graphene on 4H-SiC(0001) using non-contact scanning nonlinear dielectric microscopy, 2014 International Conference on Nanoscience + Technology, Vail, Colorado, USA, July 20-25 (2014).
  72. K. Yamasue, M. Abe, Y. Sugimoto, and Y. Cho, Site specific measurement of atomic dipole moment induced local surface potentials on Si(111)-(7×7) surface by noncontact scanning nonlinear dielectric microscopy, 2013 MRS Fall Meeting LL9.04, Boston, USA, December 1-6 (2013).
  73. K. Yamasue, M. Abe, Y. Sugimoto,and Y. Cho, Site-specific measurement of atomic dipole moment induced surface potential on Si(111)-(7×7) by noncontact scanning nonlinear dielectric microscopy, the 12th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN-12) in conjunction with the 21st International Colloquium on Scanning Probe Microscopy (ICSPM21) 5pB2-8, Tsukuba International Congress Center, Tsukuba, Japan, Nov. 4-8 (2013).
  74. N. Chinone, K. Yamasue, K. Honda, and Y. Cho, High resolution imaging of cross section of metal-oxide-semiconductor field-effect-transistor using super-higher-order nonlinear dielectric microscopy, 18th Microscopy of Semiconducting Materials Meeting, Oxford, United Kingdom, April 7-11 (2013).
  75. Y. Cho, D. Mizuno, and K. Yamasue, Observation of atomic dipole moment on hydrogen and oxygen adsorbed Si(111)-7×7 surfaces by using noncontact scanning nonlinear dielectric microscopy, International Conference on Nanoscience and Technology 2013 ASS-10-Or-12, Paris. France, September 9-13 (2013).
  76. K. Yamasue and Y. Cho, Atomic dipole moment induced variation of local surface potential on Si(111)-(7×7) surface studied by noncontact scanning nonlinear dielectric microscopy, International Conference on Nanoscience and Technology 2013 ASS-10-Or-11, Paris. France, September 9-13 (2013).
  77. K. Yamasue, D. Mizuno,and Y. Cho, Bias voltage dependence of atomic dipole moment and topography on hydrogen-adsorbed Si(111)-(7×7) surface studied by noncontact scanning nonlinear dielectric microscopy, 15th International Conference on non-contact Atomic Force Microscopy, POSTER SESSION II 14, University of Maryland, Colleage Park, Maryland, United States of America, Aug.5-Aug.9 (2013).
  78. K. Yamasue, M. Abe, Y. Sugimoto,and Y. Cho, Site specific measurement of surface potential shift on Si(111)-(7×7) surface by noncontact scanning nonlinear dielectric microscopy,15th International Conference on non-contact Atomic Force Microscopy,SYMPOSIUM AND CONTRIBUTED TALKS 51, University of Maryland, Colleage Park, Maryland, United States of America, Aug.5-Aug.9 (2013).
  79. D. Mizuno, K. Yamasue, and Y. Cho, Investigation of physical and electrical properties of hydrogen-adsorbed Si(111)-7×7 surface by using noncontact scanning nonlinear dielectric microscopy, 18th Microscopy of Semiconducting Materials Meeting ABSTRACTS, University of Oxford, United Kingdom, April 7-April 11(2013).
  80. D. Mizuno, K. Yamasue, and Y. Cho, Atomic dipole moments on hydrogen-adsorbed Si(111)-7×7 surface observed by using noncontact scanning nonlinear dielectric microscopy, 20th International Colloquium on Scanning Probe Microscopy, S6-4, Dec. 18(2012).
  81. N. Chinone, K. Yamasue, Y Hiranaga, K Honda, and Y Cho, Super higher order nonlinear dielectric microscopy with super high resolution, 2012 MRS Fall Meeting, Hynes Convention Center, Boston, Massachusetts, Nov. 25-30 (2012).
  82. D. Mizuno, K. Yamasue, and Y. Cho, Non-contact scanning nonlinear dielectric microscopy studies of atomic dipole moments on hydrogen-adsorbed Si(111)-7×7 surface, 2012 MRS Fall Meeting, Hynes Convention Center, Boston, Massachusetts, Nov. 25-30 (2012).
  83. N. Chinone, K. Yamasue, Y. Hiranaga, K. Honda, and Y. Cho, Resolution improvement of scanning nonlinear dielectric microscopy by measuring the super higher-order nonlinear dielectric constants, 15th European Microscopy Congress, Manchester, United Kingdom, September 16-21 (2012).
  84. N. Chinone, K. Yamasue, Y. Hiranaga, K. Honda, and Y. Cho, Super-higher order nonlinear dielectric microscopy studies on ferroelectric materials and semiconductor devices, International Conference on Nanoscience + Technology, PO6.8, Paris, France, July 23-27 (2012).
  85. D. Mizuno, K. Yamasue, and Y. Cho，Observation of dipole moments on hydrogen-adsorbed Si(111)-7×7 surface by non-contact scanning nonlinear dielectric microscopy，15th International Conference on non-contact Atomic Force Microscopy，17939, Český Krumlov，Czech republic，July 1-5 (2012).
  86. K. Yamasue and Y. Cho，Simultaneous imaging of current and local dipole moments of Si (111)-(7×7) surface by noncontact scanning nonlinear dielectric microscopy，15th International Conference on non-contact Atomic Force Microscopy，17940, Český Krumlov，Czech republic，July 1-5 (2012).
  87. N. Chinone, K. Yamasue, Y. Hiranaga, Y. Cho, Super higher-order nonlinear dielectric microscopy, 19th International Colloquium　on Scanning Probe Microscopy (ICSPM19), Toyako Manseikaku, Hokkaido, Japan, December 19-21 (2011).
  88. K. Yamasue and Y. Cho, Observation of local dipole moments on cleaned Si(111) surface with defects by non-contact scanning nonlinear dielectric microscopy, 14th International Conference on non-contact Atomic Force Microscopy, Lindau, Germany, September 18-22(2011).
  89. K. Yamasue, K. Kobayashi, H. Yamada, K. Matsushige, and T. Hikihara, Chaotic cantilever oscillation and its control in amplitude modulation atomic force microscopy, 2nd Multifrequency AFM Conference, Holiday Inn Madrid, Madrid, Spain, June 15-16 (2009).
  90. K. Yamasue, K. Kobayashi, H. Yamada, K. Matsushige, and T. Hikihara, Control of chaotic sensor oscillation in dynamic-mode atomic force microscopy, The 5th International Conference on Nonlinear Science (Dynamics Days Asia Pacific 5), Nara, Japan, September 9-12 (2008).
  91. K. Yamasue, K. Kobayashi, H. Yamada, K. Matsushige, and T. Hikihara, Experimental study on stabilization of chaotic cantilever oscillation in AM-AFM by time-delayed feedback control, 11th International Conference on Non-contact Atomic Force Microscopy (NCAFM-2008), HOTEL Rafael-Atocha, Madrid, Spain, September 16-19, (2008).
  92. T. Tomita, K. Yamasue, and T. Hikihara, Parametric excitation of piezoelectric cantilevers based on elasticity control, 9th International Conference on Atomically Controlled Surfaces(ACSIN-9), Interfaces and Nanostructures, Komaba Research Campus of The University of Tokyo, Tokyo, Japan, November 11-15 (2007).
  93. K. Yamasue and T. Hikihara, Improvement of transient response in non-contact atomic force microscopy: an application of time delayed feedback control, XXV Dynamics Days Europe 2005, Berlin, Germany, July 25-28, (2005).
  94. K. Yamasue and T. Hikihara, Influence of remaining chaos on convergence of solutions in time delayed feedback controlled Duffing system, XXI International Congress of Theoretical and Applied Mechanics, Warsaw, Poland, August 15-21 (2004).
  95. T. Hikihara and K. Yamasue, A Study on domain of attraction in time-delayed feedback controlled Duffing system, Dynamics Days Europe 2002, Heidelberg, Germany, July 15-19 (2002).
↑

国内発表†

  1. 石塚 太陽，山末 耕平，走査型非線形誘電率顕微鏡によるMoS2積層pn接合のナノスケール観察，第71回応用物理学会春季学術講演会 23p-31B-5，東京都市大学世田谷キャンパス，March 22-25(2024，発表予定).
  2. 山末 耕平，長 康雄，時間分解走査型非線形誘電率顕微鏡による局所MOS容量-電圧特性測定とゆらぎ解析，第71回応用物理学会春季学術講演会 23p-12F-5，東京都市大学世田谷キャンパス，March 22-25(2024，発表予定).
  3. 石塚 太陽，山末 耕平，走査型非線形誘電率顕微鏡による機械剥離単層MoS2の局所CV特性測定，第84回応用物理学会秋季学術講演会 23p-A202-10，熊本城ホール，Sep. 19-23(2023).
  4. 住吉 晶，山末 耕平，長 康雄，中村 淳，第一原理計算を用いたSi(111)-(2x2)表面における表面双極子の可視化，第84回応用物理学会秋季学術講演会 22p-A307-4，熊本城ホール，Sep. 19-23(2023).
  5. 山末 耕平，尾形 結友，松本 翼，德田 規夫，長 康雄，時間分解SNDMによるAl2O3/ダイヤモンドの局所MOS容量-電圧特性測定，第84回応用物理学会秋季学術講演会 21p-C402-14，熊本城ホール，Sep. 19-23(2023).
  6. 山末 耕平，時間分解走査型非線形誘電率顕微鏡による次世代半導体材料の微視的評価，通研共同プロジェクト研究(R05/S01) 夏季研究会 ～先端的コヒーレント波技術の応用研究～，静岡大学 電子工学研究所，Aug. 4 (2023).
  7. 石塚 太陽， 山末 耕平，走査型非線形誘電率顕微鏡によるSiO2上機械剥離MoS2の局所DLTS測定，第70回 応用物理学会春季学術講演会 16p-B414-3，上智大学四谷キャンパス+オンライン，Mar. 15-18 (2023).
  8. 高野 幸喜，山末 耕平，加藤 俊顕，金子 俊郎，長 康雄，走査型非線形誘電率顕微鏡による機械剥離WSe2/SiO2と架橋型WSe2のキャリア分布の観察，2020年 第67回応用物理学春季学術講演会 15a-A404-11，上智大学四谷キャンパス，March 12-15(2020). [新型コロナウィルス感染症拡大のため中止．発表扱い]
  9. 保坂 杏奈，山末 耕平，Woerle Judith，Ferro Gabriel，Grossner Ulrike，Camarda Massimo，長 康雄，時間分解・局所DLTS 法 を用いた マクロステップ を有するSiO2/SiC の界面準位密度分布の測定(2), 2020年 第67回応用物理学春季学術講演会 15p-A201-9，上智大学四谷キャンパス，March 12-15(2020). [新型コロナウィルス感染症拡大のため中止．発表扱い]
  10. 鈴木 小春，山末 耕平，長 康雄，局所DLTSを用いたSiO₂/Si界面におけるバイアスストレスの影響評価に関する検討，2020年 第67回応用物理学春季学術講演会 12p-A202-2，上智大学四谷キャンパス，March 12-15(2020). [新型コロナウィルス感染症拡大のため中止．発表扱い]
  11. 山末 耕平，長 康雄，界面欠陥分布の空間スケールとSiC MOSFETの電界効果移動度の関係に関する数値的検討，2020年 第67回応用物理学春季学術講演会 13a-PA6-5，上智大学四谷キャンパス，March 12-15(2020).
  12. 高野 幸喜，山末 耕平，長 康雄，絶縁膜付き探針を用いた層状半導体のSNDM観察 ，2019年 第80回応用物理学秋季学術講演会 18a-C310-5, 北海道大学札幌キャンパス，Septemper 18-21(2019).
  13. 保坂 杏奈，山末 耕平, Judith Woerle, Corrado Bongiorno, Gabriel Ferro, Ulrike Grossner, Massimo Camarda, 長 康雄, 局所DLTS法を用いたマクロステップを有するSiCにおける界面準位密度分布の測定，2019年 第80回応用物理学秋季学術講演会 20a-E311-4, 北海道大学札幌キャンパス，Septemper 18-21（2019）
  14. 鈴木 小春，山末 耕平，長 康雄, 走査型非線形誘電率顕微鏡を用いたSiO2/Siにおける界面状態不均一の可視化に関する検討，2019年 第80回応用物理学秋季学術講演会 18a-E303-10, 北海道大学札幌キャンパス，Septemper 18-21（2019）
  15. 山末 耕平，山岸 裕史，長 康雄，不均一な界面欠陥分布がSiC MOSFETのチャネル移動度に及ぼす影響 ―局所DLTS測定とデバイスシミュレーションに基づく検討― 2019年 第80回応用物理学秋季学術講演会 20a-E311-11，北海道大学札幌キャンパス，Septemper 18-21（2019）
  16. 山末 耕平，長 康雄，非接触走査型非線形誘電率ポテンショメトリによる金属表面の双極子誘起電位の観察，2019年 第66回応用物理学春季学術講演会 11a-W933-2，東京工業大学大岡山キャンパス，東京都目黒区，March 9-12 (2019).
  17. 高野 幸喜，山末 耕平，長 康雄，走査型非線形誘電率顕微鏡による半導体キャリア分布観察のための絶縁膜付きカンチレバーの開発 (2)，2019年 第66回応用物理学春季学術講演会 10a-W933-8，東京工業大学大岡山キャンパス，東京都目黒区，March 9-12 (2019).
  18. 高野 幸喜，山末 耕平，長 康雄，走査型非線形誘電率顕微鏡による半導体キャリア分布観察のための絶縁膜付きカンチレバーの開発，2018年 第79回応用物理学秋季学術講演会 18p-143-9，名古屋国際会議場，名古屋市，Sep. 18-21 (2018).
  19. 山末 耕平，加藤 俊顕，金子 俊郎，長 康雄，走査型非線形誘電率顕微鏡と静電気力顕微鏡を用いたSiO2上剥離WSe2におけるキャリア分布観察，2018年 第79回応用物理学秋季学術講演会 18p-224B-11，名古屋国際会議場，名古屋市，Sep. 18-21 (2018).
  20. 山末 耕平，加藤 俊顕，金子 俊郎，長 康雄，走査型非線形誘電率顕微鏡を用いたSiO2上剥離WSe2観察におけるキャリア分布の直流バイアス依存性，2018年 第65回応用物理学春季学術講演会 20p-C202-7，早稲田大学西早稲田キャンパス，東京都新宿区，March 17-20 (2018).
  21. 山末 耕平，長康雄，走査型非線形誘電率顕微鏡によるSiO2/Si基板上の剥離二硫化モリブデンの観察，2017年 第78回応用物理学秋季学術講演会 7p-C11-10，福岡国際会議場・福岡国際センター・福岡サンパレスホテル，福岡市，Sep. 5-8 (2017).
  22. 山末 耕平，長康雄，走査型非線形誘電率ポテンショメトリを用いたGaN の自発分極測定に関する実験的検討，2017年 第64回応用物理学春季学術講演会 14p-414-3，パシフィコ横浜，横浜市，March 14-17 (2017).
  23. 山末 耕平，長康雄，非接触走査型非線形誘電率ポテンショメトリによるSi(111)-(7x7)表面における分極電荷密度の原子スケール観察，2016年 第77回応用物理学秋季学術講演会 114p-A32-4，朱鷺メッセ，新潟市，Sep. 13-16 (2016).
  24. 向出 周太，山末 耕平，阿部真之，長康雄，非接触走査型非線形誘電率ポテンショメトリとケルビンプローブフォース顕微鏡法の実験的比較，2016年 第63回応用物理学会春季学術講演会22a-H113-4，東京工業大学 大岡山キャンパス，March 19-22(2016).
  25. 山末 耕平，長康雄，走査型非線形誘電率ポテンショメトリによる表面自発分極の測定に関する検討，2016年 第63回応用物理学会春季学術講演会22a-H113-5，東京工業大学 大岡山キャンパス，March 19-22(2016).
  26. 山末 耕平，吹留博一，田島圭一郎，舩窪一智，末光眞希，長康雄，非接触走査型非線形誘電率ポテンショメトリによる4H-SiC(000\bar{1})上グラフェンの観察，2015年 第76回応用物理学会秋季学術講演会 5p-2T-17，名古屋国際会議場,Sep.13-16(2015).
  27. 山末 耕平，長 康雄，走査型非線形誘電率ポテンショメトリによる自発分極誘起電位の選択的測定，2015年 第62回応用物理学会春季学術講演会 14a-D9-7，東海大学湘南キャンパス，March 11-14(2015).
  28. 鈴木 将敬，山末 耕平，長 康雄，非接触走査型非線形誘電率顕微鏡を用いた酸素吸着Si(100)-2×1表面における電気双極子モーメント分布の観察，2015年 第62回応用物理学会春季学術講演会 12a-D9-1，東海大学湘南キャンパス，March 11-14(2015).
  29. 山末 耕平，吹留博一，舩窪一智，末光眞希，長康雄，非接触走査型非線形誘電率顕微鏡による水素インターカレートされた4H-SiC(0001)上グラフェンの観察，第75回応用物理学会秋季学術講演会，18p-B1-10，北海道大学札幌キャンパス，Sep.17-Sep.20（2014）
  30. 山末 耕平，吹留博一，舩窪一智，末光眞希，長康雄，非接触走査型非線形誘電率顕微鏡による4H-SiC(0001)上グラフェンの高分解能観察，2014年 第61回応用物理学会春季学術講演会 18p-E2-5，青山学院大学相模原キャンパス，March 17-20(2014).
  31. 山末 耕平，長 康雄，非接触走査型非線形誘電率顕微鏡による形状・表面電位の同時観察，2014年 第61回応用物理学会春季学術講演会 19p-D5-10，青山学院大学相模原キャンパス，March 17-20(2014).
  32. 鈴木 将敬，山末 耕平，阿部 真之，杉本 宜昭，長 康雄，非接触走査型非線形誘電率顕微鏡を用いたSi(100)-2×1表面における双極子モーメント分布の観察，2014年 第61回応用物理学会春季学術講演会 19a-D5-5，青山学院大学相模原キャンパス，March 17-20(2014).
  33. 山末 耕平，阿部 真之，杉本 宜昭，長 康雄，非接触走査型非線形誘電率顕微鏡を用いたSi(111)-(7 ×7) 表面における表面電位のサイト依存性測定，第74回応用物理学会秋季学術講演会，19p-D2-10，同志社大学田辺キャンパス，Sep.16-Sep.20（2013）
  34. 水野 大督，山末 耕平，長 康雄，非接触走査型非線形誘電率顕微鏡を用いた水素吸着Si(111)-7×7表面の形状像と双極子モーメント像の外部電場依存性の観察，第60回応用物理学会春季学術講演会，30a-D3-12，神奈川工科大学, March 30(2013).
  35. 山末 耕平，長 康雄，非接触走査型非線形誘電率顕微鏡を用いたSi(111)-(7×7)表面の双極子モーメント像と表面電位像の同時観察，第60回応用物理学会春季学術講演会，30a-D3-12，神奈川工科大学, March 30(2013).
  36. 山末 耕平，長 康雄，非接触走査型非線形誘電率顕微鏡を用いたSi(111)再構成表面観察における双極子モーメント分布の可視化メカニズムに関する検討，2012年秋季 第73回 応用物理学会学術講演会，12p-E2-10，愛媛大学城北地区 松山大学文京キャンパス，September 9(2012).
  37. 茅根 慎通，山末 耕平，本田 耕一郎，長 康雄，超高次非線形誘電率顕微鏡によるMOS型電界効果トランジスタ断面の高分解能観察，2012年秋季 第73回 応用物理学会学術講演会，12p-E2-11，愛媛大学城北地区，松山大学文京キャンパス，September 9(2012).
  38. 茅根 慎通，山末 耕平，平永 良臣，長 康雄，超高次非線形誘電率顕微鏡を用いた強誘電体ナノ分極の観察，第29回強誘電体応用会議(FMA29)，25-B-12，コープイン京都，May 25(2012).
  39. 茅根 慎通，山末 耕平，平永 良臣，長 康雄，高次非線形誘電率計測による走査型非線形誘電率顕微鏡の高分解能化，2012年春季 第59回応用物理学関係連合講演会，16a-F5-5，早稲田大学早稲田キャンパス，March 16 (2012).
  40. 水野 大督，山末 耕平，長 康雄，非接触走査型非線形誘電率顕微鏡を用いた水素吸着Si(111)-7×7 表面の観察，2012年春季 第59回応用物理学関係連合講演会，16a-F5-6，早稲田大学早稲田キャンパス，March 16 (2012).
  41. 山末 耕平，長 康雄，非接触走査型非線形誘電率顕微鏡を用いたSi(111)-(7×7) 表面の非線形誘電率像/ 電流像同時観察，2012年春季 第59回応用物理学関係連合講演会，16a-F5-7，早稲田大学早稲田キャンパス，March 16 (2012).
  42. 山末 耕平，長 康雄，非接触走査型非線形誘電率顕微鏡によるSi(111)表面の電荷分布に関する検討，2011年秋季 第72回 応用物理学会学術講演会，31a-ZC-8，山形大学小石川キャンパス，Aug. 29 - Sep. 2 (2011).
  43. 山末 耕平，長 康雄，走査型非線形誘電率顕微鏡によるSi(111)表面の分極分布観察，第28回強誘電体応用会議(FMA28)，27-B-14, コープイン京都，May 27 (2011).
  44. 山末 耕平，長 康雄，非接触走査型非線形誘電率顕微鏡によるSi(111) 表面のドメイン境界観察，2011年春季 第58回応用物理学関係連合講演会，27a-BR-5，神奈川工科大学，March 27 (2011).[東北地方太平洋沖地震のため中止．発表扱い]
  45. 山末 耕平，引原 隆士，時間遅れフィードバック制御された系における解の一様終局有界性について，電子情報通信学会 非線形問題研究会，屋久島環境文化村センター，Nov. 11 (2009).
  46. 山末 耕平，小林 圭，山田 啓文，松重 和美，引原 隆士，タッピングモードAFMにおけるカンチレバー非線形振動に関する実験的検討，2009年秋季第70回応用物理学会学術講演会，8a-E-8，富山大学 五福キャンパス，Sep. 8 (2009).
  47. 山末 耕平，小林 圭，山田 啓文，松重 和美，引原 隆士，時間遅れフィードバック制御の振幅変調型原子間力顕微鏡への応用，第58理論応用力学講演会，2C02，カオスとその応用，日本学術会議，Jun. 10 (2009).
  48. K. Yamasue, K. Kobayashi, H. Yamada, K. Matsushige, and T. Hikihara, Stabilization of cantilever oscillation in tapping-mode AFM using time-delayed feedback control, 2008年秋季 第69回応用物理学会学術講演会，中部大学，Sep. 2-5 (2008).
  49. K. Yamasue, K. Kobayashi, H. Yamada, K. Matsushige, and T. Hikihara, Implementation of time-delayed feedback control to tapping-mode atomic force microscopy, 2008年春季 第55回応用物理学関係連合講演会，28p-Q-16, 日本大学理工学部 船橋キャンパス，March. 27-30 (2008).
  50. 山末 耕平，小林 圭，山田 啓文，松重 和美，引原 隆士，磁場励振を用いたカンチレバーの励振スペクトルにおけるスプリアス応答の抑制---時間遅れフィードバック制御のDFMへの適用に向けた実験的検討---, 2007年秋季 第68回応用物理学会学術講演会, 7p-P15-11，北海道工業大学，Sep. 4-8 (2007).
  51. K. Yamasue and T. Hikihara, Annihilation of periodic orbits and global structure in time-delayed feedback control of chaos, 第51回システム制御情報学会 研究発表講演会，5W1-2，京都テルサ，May 16 (2007).
  52. K. Yamasue and T. Hikihara，Prototyping of cantilever controller for tapping-mode atomic force microscopy: verification experiment toward implementation of the time-delayed feedback control，2007年春季 第54回応用物理学関係連合講演会，30p-SL-1，青山学院大学 相模原キャンパス，March 30 (2007)．
  53. 冨田 達也，山末 耕平，引原 隆士，圧電薄膜カンチレバーのパラメータ制御に関する一検討 ---Q値および弾性の制御---，電子情報通信学会 非線形問題研究会，サンポートホール高松，January 17 (2007)．
  54. 冨田 達也，山末 耕平，引原 隆士，圧電素子を用いたセンサの高感度化に関する数値的検討，電子情報通信学会 2006年総合大会，国士舘大学 世田谷キャンパス, March 27 (2006).
  55. K. Yamasue and T. Hikihara, Stabilization of microcantilever probe motion in non-contact atomic force microscopy: application of time delayed feedback control, システム制御情報学会 研究発表講演会，制御応用(2), 5B4-1, 京都テルサ，May 19 (2005).
  56. K. Yamasue and T. Hikihara, Improved Transient Response in non-contact Atomic Force Microscopy under Time Delayed Feedback Control，電子情報通信学会，2005年総合大会，大阪大学 豊中キャンパス，March 22 (2005).
  57. 山末 耕平，引原 隆士，時間遅れフィードバック制御の非接触原子間力顕微鏡への適用，電子情報通信学会 非線形問題研究会，香川大学，January 24 (2005).
  58. 山末 耕平，引原 隆士，時間遅れフィードバック制御されたDuffing系に生じる複数の定常状態とカオス残存の関係，電子情報通信学会 回路とシステム/非線形問題研究会，京都大学桂キャンパス, September 13 (2004).
  59. 山末 耕平，引原 隆士，時間遅れフィードバック制御された系におけるカオスの残存とその過渡挙動への影響について，システム制御情報学会 研究発表講演会, 2021, 京都テルサ, May 20 (2004)．
  60. 山末 耕平, 引原 隆士, 時間遅れフィードバック制御された磁気弾性系の解の収束と不変多様体, 電子情報通信学会 非線形問題研究会, 公立はこだて未来大学，July 14 (2003).
  61. 山末 耕平, 引原 隆士, 時間遅れ系の関数空間における引力圏構造の検討 ---Duffing系の時間遅れフィードバック制御---, システム制御情報学会 研究発表講演会, 京都テルサ, May 16 (2003).
  62. 引原 隆士, 山末 耕平, 時間遅れフィードバック制御されたDuffing系の収束解に関する初期関数の引力圏構造, 電子情報通信学会, 非線形問題研究会, NLP2002-50, 大阪大学, September 4 (2002).
  63. 引原 隆士, 山末 耕平, 遅れフィードバック制御された磁気弾性系安定化の過渡状態に関する数値的検討, システム制御情報学会 研究発表講演会, 学習・カオス・離散事象系 1030, 神戸国際会議場, May 16 (2002).
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