Prof.Yasuo Cho received the Commendation for Science and Technology by the Minister of Education, Culture, Sports, Science and Technology, Japan(Prizes for Science and Technology, Development Category)(15th, April 2015)
Scanning nonlinear dielectric microscopy with atomic resolution has been developed. This microscopy has a world highest sensitivity for the capacitance variation of the order of 10e-22F. This technique can be applicable for evaluation and development of next generation high performance electronic devices, for example, flash memory, SiC & GaN power devices, solar cells and ultrahigh density ferroelectric data storage, etc..
Contact
Dielectric Nano-Devices,Information Devices Division
Research Institute of Electrical Communication,Tohoku University
Professor Yasuo Cho E-mail:yasuocho@riec.tohoku.ac.jp
